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https://hdl.handle.net/20.500.14279/9815
Τίτλος: | Dynamic fault-tolerant routing algorithm for networks-on-chip based on localised detouring paths | Συγγραφείς: | Vitkovskiy, Arseniy Soteriou, Vassos Nicopoulos, Chrysostomos |
Major Field of Science: | Engineering and Technology | Field Category: | Electrical Engineering - Electronic Engineering - Information Engineering | Λέξεις-κλειδιά: | Network On Chip;Fault-Tolerant Routing;Virtual Channel | Ημερομηνία Έκδοσης: | 2013 | Πηγή: | IET Computers and Digital Techniques, 2013, vol. 7, no. 2, pp. 93-103 | Volume: | 7 | Issue: | 2 | Start page: | 93 | End page: | 103 | Περιοδικό: | IET Computers and Digital Techniques | Περίληψη: | Downscaled complementary metal-oxide semiconductor (CMOS) technology feature sizes have enabled massive transistor integration densities. Multi-core chips with billions of transistors are now a reality. However, this rapid increase in on-chip resources has come at the expense of higher susceptibility to defects and wear-out. The inter-router communication links of networks-on-chips (NoCs) are composed of metal wires that are especially vulnerable to catastrophic physical effects such as those of electro-migration, which can even cause link disconnects. To address this hazard, fault-tolerant (FT) routing algorithms sustain on-chip communication by re-routing messages around faulty links, or regions. This work presents a new FT routing scheme that employs a localised re-routing approach. Packets are de-toured around faulty links/regions based on purely local and distributed decisions, and without any global link state knowledge. The algorithm, which is proven to be deadlock-and livelock-free, also handles dynamically occurring faults. Detailed evaluation with synthetic traffic patterns and real applications within a full-system simulation environment demonstrate the efficacy of the new scheme with up to 12% of NoC links being faulty. Synthesis results also prove the feasibility of the proposed protocol at modest hardware and power consumption overheads of only over 5 and 2.5%, respectively. | URI: | https://hdl.handle.net/20.500.14279/9815 | ISSN: | 1751861X | DOI: | 10.1049/iet-cdt.2012.0054 | Rights: | © The Institution of Engineering and Technology | Type: | Article | Affiliation: | Cyprus University of Technology University of Cyprus |
Publication Type: | Peer Reviewed |
Εμφανίζεται στις συλλογές: | Άρθρα/Articles |
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