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https://hdl.handle.net/20.500.14279/9241
Τίτλος: | Baselines for lifetime of organic solar cells | Συγγραφείς: | Gevorgyan, Suren A. Espinosa, Nieves Ciammaruchi, Laura Roth B., Bérenger Livi, Francesco Tsopanidis, Stylianos Züfle, Simon Queirós, Sara Gregori, Alberto Benatto, Gisele Alves Dos Reis Corazza, Michael Madsen, Morten V. Hösel, Markus Beliatis, Michail J. Larsen-Olsen, Thue Trofod Pastorelli, Francesco Castro, António Mingorance, Alba Lenzi, Veniero Fluhr, Daniel Roesch, Roland Maria Duarte Ramos, Marta Savva, Achilleas Hoppe, Harald Marques, Luís Silvino Alves Burgués-Ceballos, Ignasi Georgiou, Efthymios Serrano-Luján, Lucia Krebs, Frederik C. |
metadata.dc.contributor.other: | Σάββα, Αχιλλέας Γεωργίου, Ευθύμιος |
Major Field of Science: | Engineering and Technology | Field Category: | Materials Engineering | Λέξεις-κλειδιά: | Degradation;Lifetime baseline;Lifetime database;Organic photovoltaics | Ημερομηνία Έκδοσης: | 23-Νοε-2016 | Πηγή: | Advanced Energy Materials, 2016, vol. 6, no. 22 | Volume: | 6 | Issue: | 22 | DOI: | 10.1002/aenm.201600910 | Περιοδικό: | Advanced Energy Materials | Περίληψη: | The process of accurately gauging lifetime improvements in organic photovoltaics (OPVs) or other similar emerging technologies, such as perovskites solar cells is still a major challenge. The presented work is part of a larger effort of developing a worldwide database of lifetimes that can help establishing reference baselines of stability performance for OPVs and other emerging PV technologies, which can then be utilized for pass-fail testing standards and predicting tools. The study constitutes scanning of literature articles related to stability data of OPVs, reported until mid-2015 and collecting the reported data into a database. A generic lifetime marker is utilized for rating the stability of various reported devices. The collected data is combined with an earlier developed and reported database, which was based on articles reported until mid-2013. The extended database is utilized for establishing the baselines of lifetime for OPVs tested under different conditions. The work also provides the recent progress in stability of unencapsulated OPVs with different architectures, as well as presents the updated diagram of the reported record lifetimes of OPVs. The presented work is another step forward towards the development of pass-fail testing standards and lifetime prediction tools for emerging PV technologies. | URI: | https://hdl.handle.net/20.500.14279/9241 | ISSN: | 16146832 | DOI: | 10.1002/aenm.201600910 | Rights: | © Wiley | Type: | Article | Affiliation: | Technical University of Denmark The Institute of Photonic Sciences University of Minho Zurich University of Applied Sciences Fluxim AG Université de Pau et des Pays de l'Adour Catalan Institute of Nanoscience and Nanotechnology Barcelona Institute of Science and Technology Technische Universität Ilmenau Cyprus University of Technology Imperial College London Friedrich Schiller University of Jena |
Publication Type: | Peer Reviewed |
Εμφανίζεται στις συλλογές: | Άρθρα/Articles |
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