Correlation between thickness, conductivity and thermal degradation mechanisms of PEDOT:PSS films
Date Issued
2009
DOI
10.1063/1.3322407
Abstract
D.c. conductivity σ and thermal degradation measurements on PEDOT:PSS films of different thicknesses d = 50, 120 and 180 nm are reported. The experimental results are consistent with a hopping type carrier transport. For the films with thickness d = 50 nm, which consist of almost one single layer of PEDOT:PSS conductive grains, the conductivity and the heat aging are consistent with a hopping transport in a granular metal type structure. However, for films with d = 120 and 180 nm, in which many conductive grains constitute the film thickness, a completely different behaviour is exhibited. An explanation of this is proposed
Subjects