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https://hdl.handle.net/20.500.14279/4457| Title: | Correlation between thickness, conductivity and thermal degradation mechanisms of PEDOT:PSS films | Authors: | Choulis, Stelios A. Vitoratos, Evangelos G. Sakkopoulos, Sotirios A. Dalas, Evangelos Paliatsas, N. Emmanouil, Konstantinos Malkaj, Partizan |
metadata.dc.contributor.other: | Χούλης, Στέλιος Α. | Major Field of Science: | Engineering and Technology | Field Category: | Mechanical Engineering | Keywords: | Conducting polymers;Solar cells | Issue Date: | 2009 | Source: | Organized by the hellenic psysical society with cooperation of the psysics departments of universities in Greece: 7th international conference of the balkan physical union, Volume 1203, Pages 178-181 | Abstract: | D.c. conductivity σ and thermal degradation measurements on PEDOT:PSS films of different thicknesses d = 50, 120 and 180 nm are reported. The experimental results are consistent with a hopping type carrier transport. For the films with thickness d = 50 nm, which consist of almost one single layer of PEDOT:PSS conductive grains, the conductivity and the heat aging are consistent with a hopping transport in a granular metal type structure. However, for films with d = 120 and 180 nm, in which many conductive grains constitute the film thickness, a completely different behaviour is exhibited. An explanation of this is proposed | URI: | https://hdl.handle.net/20.500.14279/4457 | ISBN: | 978-0-7354-0740-4 | DOI: | 10.1063/1.3322407 | Rights: | © 2010 American Institute of Physics | Type: | Book Chapter | Affiliation : | University of Patras University of Tirana Cyprus University of Technology |
| Appears in Collections: | Κεφάλαια βιβλίων/Book chapters |
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