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https://hdl.handle.net/20.500.14279/4412
Τίτλος: | Does microstructure matter for statistical nanoindentation techniques? | Συγγραφείς: | Constantinides, Georgios Ulm, Franz Josef Vandamme, Matthieu Jennings, Hamlin M. Vanzo, James Bentivegna, Michelle Krakowiak, Konrad J. Bobko, Christopher P. Vliet, Krystyn J Van |
metadata.dc.contributor.other: | Κωνσταντινίδης, Γιώργος | Major Field of Science: | Engineering and Technology | Λέξεις-κλειδιά: | Microstructure;Statistical methods;Cement composites | Ημερομηνία Έκδοσης: | Ιαν-2010 | Πηγή: | Cement and Concrete Composites, 2010, vol. 32, no. 1, pp. 92-99 | Volume: | 32 | Issue: | 1 | Start page: | 92 | End page: | 99 | Περιοδικό: | Cement and Concrete Composites | Περίληψη: | In their paper, Trtik et al. (2009) identify spurious peaks in the application of statistical nanoindentation technique as a critical obstacle for mechanical phase identification. In this discussion, we show that Trtik et al.'s finding is a consequence of an unrealistic virtual 3-D checkerboard microstructure considered by the authors. These peaks are not a general feature of indentation on multiphase materials, nor can the presence of such peaks be attributed to an intrinsic shortcoming of the grid-indentation technique. We also show that the authors' assertion of the absence of homogeneous material regions extending beyond 3 μm in cementitious materials is groundless. | URI: | https://hdl.handle.net/20.500.14279/4412 | ISSN: | 09589465 | DOI: | 10.1016/j.cemconcomp.2009.08.007 | Rights: | © Elsevier | Type: | Article | Affiliation: | Massachusetts Institute of Technology Universite Paris Northwestern University University of Minho Cyprus University of Technology North Carolina State University |
Publication Type: | Peer Reviewed |
Εμφανίζεται στις συλλογές: | Άρθρα/Articles |
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