Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.14279/4412
Title: Does microstructure matter for statistical nanoindentation techniques?
Authors: Constantinides, Georgios 
Ulm, Franz Josef 
Vandamme, Matthieu 
Jennings, Hamlin M. 
Vanzo, James 
Bentivegna, Michelle 
Krakowiak, Konrad J. 
Bobko, Christopher P. 
Vliet, Krystyn J Van 
metadata.dc.contributor.other: Κωνσταντινίδης, Γιώργος
Major Field of Science: Engineering and Technology
Keywords: Microstructure;Statistical methods;Cement composites
Issue Date: Jan-2010
Source: Cement and Concrete Composites, 2010, vol. 32, no. 1, pp. 92-99
Volume: 32
Issue: 1
Start page: 92
End page: 99
Journal: Cement and Concrete Composites 
Abstract: In their paper, Trtik et al. (2009) identify spurious peaks in the application of statistical nanoindentation technique as a critical obstacle for mechanical phase identification. In this discussion, we show that Trtik et al.'s finding is a consequence of an unrealistic virtual 3-D checkerboard microstructure considered by the authors. These peaks are not a general feature of indentation on multiphase materials, nor can the presence of such peaks be attributed to an intrinsic shortcoming of the grid-indentation technique. We also show that the authors' assertion of the absence of homogeneous material regions extending beyond 3 μm in cementitious materials is groundless.
URI: https://hdl.handle.net/20.500.14279/4412
ISSN: 09589465
DOI: 10.1016/j.cemconcomp.2009.08.007
Rights: © Elsevier
Type: Article
Affiliation : Massachusetts Institute of Technology 
Universite Paris 
Northwestern University 
University of Minho 
Cyprus University of Technology 
North Carolina State University 
Appears in Collections:Άρθρα/Articles

CORE Recommender
Show full item record

SCOPUSTM   
Citations

129
checked on Nov 9, 2023

WEB OF SCIENCETM
Citations 50

114
Last Week
0
Last month
0
checked on Oct 29, 2023

Page view(s) 20

455
Last Week
4
Last month
25
checked on Apr 26, 2024

Google ScholarTM

Check

Altmetric


Items in KTISIS are protected by copyright, with all rights reserved, unless otherwise indicated.