Please use this identifier to cite or link to this item:
https://hdl.handle.net/20.500.14279/18176| Title: | X-ray stability and response of polymeric photodiodes for imaging applications |
| Authors: | Keivanidis, Panagiotis E. Greenham, Neil C. Sirringhaus, Henning Friend, Richard H. Blakesley, James C. Speller, Robert Campoy-Quiles, Mariano Agostinelli, Tiziano Bradley, Donal D.C. Nelson, Jenny |
| Major Field of Science: | Engineering and Technology |
| Field Category: | Mechanical Engineering |
| Issue Date: | 28-Jan-2008 |
| Source: | Applied Physics Letters, 2008, vol. 92, iss. 2 |
| Volume: | 92 |
| Issue: | 2 |
| Journal: | Applied Physics Letters |
| Abstract: | The x-ray stability of photodiodes made of poly(9,9-di- n -octylfluorene-co-benzothiadiazole):perylene diimide, poly[2,7-(9,9-di- n -octylfluorene)-co-(1,4-phenylene-[(4-sec-butylphenyl)imino]-1,4-phenylene)]: perylene diimide and poly(3-hexylthiophene):([6,6]-phenylC61-butyric acid methyl ester) (P3HT:PCBM) blends has been examined up to lifetime doses equivalent to those used in medical x-ray digital imaging applications. Dark currents and external quantum efficiencies (EQEs) are not significantly affected after exposure to 500 Gy. Only in the case of P3HT:PCBM is a significant loss in EQE (17% of the initial value) observed. Possible reasons for the observed changes are proposed. When a scintillation layer is attached to the devices, a linear dependence of the photocurrent on the x-ray dose rate is observed for the three material systems. © 2008 American Institute of Physics. |
| ISSN: | 10773118 |
| DOI: | 10.1063/1.2834364 |
| Rights: | © AIP |
| Type: | Article |
| Affiliation : | Cavendish Laboratory University College London Imperial College London |
| Publication Type: | Peer Reviewed |
| Appears in Collections: | Άρθρα/Articles |
CORE Recommender
Sorry the service is unavailable at the moment. Please try again later.
Items in KTISIS are protected by copyright, with all rights reserved, unless otherwise indicated.