Please use this identifier to cite or link to this item:
https://hdl.handle.net/20.500.14279/18176
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Keivanidis, Panagiotis E. | - |
dc.contributor.author | Greenham, Neil C. | - |
dc.contributor.author | Sirringhaus, Henning | - |
dc.contributor.author | Friend, Richard H. | - |
dc.contributor.author | Blakesley, James C. | - |
dc.contributor.author | Speller, Robert | - |
dc.contributor.author | Campoy-Quiles, Mariano | - |
dc.contributor.author | Agostinelli, Tiziano | - |
dc.contributor.author | Bradley, Donal D.C. | - |
dc.contributor.author | Nelson, Jenny | - |
dc.date.accessioned | 2020-03-27T16:44:07Z | - |
dc.date.available | 2020-03-27T16:44:07Z | - |
dc.date.issued | 2008-01-28 | - |
dc.identifier.citation | Applied Physics Letters, 2008, vol. 92, iss. 2 | en_US |
dc.identifier.issn | 10773118 | - |
dc.description.abstract | The x-ray stability of photodiodes made of poly(9,9-di- n -octylfluorene-co-benzothiadiazole):perylene diimide, poly[2,7-(9,9-di- n -octylfluorene)-co-(1,4-phenylene-[(4-sec-butylphenyl)imino]-1,4-phenylene)]: perylene diimide and poly(3-hexylthiophene):([6,6]-phenylC61-butyric acid methyl ester) (P3HT:PCBM) blends has been examined up to lifetime doses equivalent to those used in medical x-ray digital imaging applications. Dark currents and external quantum efficiencies (EQEs) are not significantly affected after exposure to 500 Gy. Only in the case of P3HT:PCBM is a significant loss in EQE (17% of the initial value) observed. Possible reasons for the observed changes are proposed. When a scintillation layer is attached to the devices, a linear dependence of the photocurrent on the x-ray dose rate is observed for the three material systems. © 2008 American Institute of Physics. | en_US |
dc.format | en_US | |
dc.language.iso | en | en_US |
dc.relation.ispartof | Applied Physics Letters | en_US |
dc.rights | © AIP | en_US |
dc.title | X-ray stability and response of polymeric photodiodes for imaging applications | en_US |
dc.type | Article | en_US |
dc.collaboration | Cavendish Laboratory | en_US |
dc.collaboration | University College London | en_US |
dc.collaboration | Imperial College London | en_US |
dc.subject.category | Mechanical Engineering | en_US |
dc.journals | Subscription | en_US |
dc.country | United Kingdom | en_US |
dc.subject.field | Engineering and Technology | en_US |
dc.publication | Peer Reviewed | en_US |
dc.identifier.doi | 10.1063/1.2834364 | en_US |
dc.identifier.scopus | 2-s2.0-38349087203 | - |
dc.identifier.url | https://api.elsevier.com/content/abstract/scopus_id/38349087203 | - |
dc.relation.issue | 2 | en_US |
dc.relation.volume | 92 | en_US |
cut.common.academicyear | 2007-2008 | en_US |
item.openairecristype | http://purl.org/coar/resource_type/c_6501 | - |
item.openairetype | article | - |
item.cerifentitytype | Publications | - |
item.grantfulltext | none | - |
item.languageiso639-1 | en | - |
item.fulltext | No Fulltext | - |
crisitem.journal.journalissn | 1077-3118 | - |
crisitem.journal.publisher | American Institute of Physics | - |
crisitem.author.dept | Department of Mechanical Engineering and Materials Science and Engineering | - |
crisitem.author.faculty | Faculty of Engineering and Technology | - |
crisitem.author.orcid | 0000-0002-5336-249X | - |
crisitem.author.parentorg | Faculty of Engineering and Technology | - |
Appears in Collections: | Άρθρα/Articles |
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