Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.14279/18176
DC FieldValueLanguage
dc.contributor.authorKeivanidis, Panagiotis E.-
dc.contributor.authorGreenham, Neil C.-
dc.contributor.authorSirringhaus, Henning-
dc.contributor.authorFriend, Richard H.-
dc.contributor.authorBlakesley, James C.-
dc.contributor.authorSpeller, Robert-
dc.contributor.authorCampoy-Quiles, Mariano-
dc.contributor.authorAgostinelli, Tiziano-
dc.contributor.authorBradley, Donal D.C.-
dc.contributor.authorNelson, Jenny-
dc.date.accessioned2020-03-27T16:44:07Z-
dc.date.available2020-03-27T16:44:07Z-
dc.date.issued2008-01-28-
dc.identifier.citationApplied Physics Letters, 2008, vol. 92, iss. 2en_US
dc.identifier.issn10773118-
dc.description.abstractThe x-ray stability of photodiodes made of poly(9,9-di- n -octylfluorene-co-benzothiadiazole):perylene diimide, poly[2,7-(9,9-di- n -octylfluorene)-co-(1,4-phenylene-[(4-sec-butylphenyl)imino]-1,4-phenylene)]: perylene diimide and poly(3-hexylthiophene):([6,6]-phenylC61-butyric acid methyl ester) (P3HT:PCBM) blends has been examined up to lifetime doses equivalent to those used in medical x-ray digital imaging applications. Dark currents and external quantum efficiencies (EQEs) are not significantly affected after exposure to 500 Gy. Only in the case of P3HT:PCBM is a significant loss in EQE (17% of the initial value) observed. Possible reasons for the observed changes are proposed. When a scintillation layer is attached to the devices, a linear dependence of the photocurrent on the x-ray dose rate is observed for the three material systems. © 2008 American Institute of Physics.en_US
dc.formatpdfen_US
dc.language.isoenen_US
dc.relation.ispartofApplied Physics Lettersen_US
dc.rights© AIPen_US
dc.titleX-ray stability and response of polymeric photodiodes for imaging applicationsen_US
dc.typeArticleen_US
dc.collaborationCavendish Laboratoryen_US
dc.collaborationUniversity College Londonen_US
dc.collaborationImperial College Londonen_US
dc.subject.categoryMechanical Engineeringen_US
dc.journalsSubscriptionen_US
dc.countryUnited Kingdomen_US
dc.subject.fieldEngineering and Technologyen_US
dc.publicationPeer Revieweden_US
dc.identifier.doi10.1063/1.2834364en_US
dc.identifier.scopus2-s2.0-38349087203-
dc.identifier.urlhttps://api.elsevier.com/content/abstract/scopus_id/38349087203-
dc.relation.issue2en_US
dc.relation.volume92en_US
cut.common.academicyear2007-2008en_US
item.fulltextNo Fulltext-
item.cerifentitytypePublications-
item.grantfulltextnone-
item.openairecristypehttp://purl.org/coar/resource_type/c_6501-
item.openairetypearticle-
item.languageiso639-1en-
crisitem.journal.journalissn1077-3118-
crisitem.journal.publisherAmerican Institute of Physics-
crisitem.author.deptDepartment of Mechanical Engineering and Materials Science and Engineering-
crisitem.author.facultyFaculty of Engineering and Technology-
crisitem.author.orcid0000-0002-5336-249X-
crisitem.author.parentorgFaculty of Engineering and Technology-
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