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https://hdl.handle.net/20.500.14279/1720| Τίτλος: | A method for the precise measurement of the difference between two low frequencies |
| Συγγραφείς: | Kasparis, Takis Voulgaris, Nicholas C. Halkias, Christos C. |
| metadata.dc.contributor.other: | Κασπαρής, Τάκης |
| Major Field of Science: | Engineering and Technology |
| Field Category: | Electrical Engineering - Electronic Engineering - Information Engineering |
| Λέξεις-κλειδιά: | Electronic circuits;Counting;Signal processing;Electric measurements |
| Ημερομηνία Έκδοσης: | 1985 |
| Πηγή: | IEEE Transactions on Instrumentation and Measurement, March 1985, vol. IM-34, no. 1 |
| Περιοδικό: | IEEE Transactions on Instrumentation and Measurement |
| Conference: | Transactions on Instrumentation and Measurement |
| Περίληψη: | A method is presented for measuring the difference between two low frequencies with high resolution. The method is based on multiplying the two incoming frequencies by a large factor and then using a BCD up/down counter to store and display the resulting frequency difference. |
| URI: | https://hdl.handle.net/20.500.14279/1720 |
| ISSN: | 00189456 |
| DOI: | 10.1109/TIM.1985.4315268 |
| Rights: | © 1985 IEEE |
| Type: | Article |
| Affiliation: | City University of New York |
| Affiliation: | University of Central Florida |
| Publication Type: | Peer Reviewed |
| Εμφανίζεται στις συλλογές: | Άρθρα/Articles |
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