Please use this identifier to cite or link to this item:
https://hdl.handle.net/20.500.14279/1720
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kasparis, Takis | - |
dc.contributor.author | Voulgaris, Nicholas C. | - |
dc.contributor.author | Halkias, Christos C. | - |
dc.contributor.other | Κασπαρής, Τάκης | - |
dc.date.accessioned | 2013-02-19T15:24:54Z | en |
dc.date.accessioned | 2013-05-17T05:22:24Z | - |
dc.date.accessioned | 2015-12-02T10:00:11Z | - |
dc.date.available | 2013-02-19T15:24:54Z | en |
dc.date.available | 2013-05-17T05:22:24Z | - |
dc.date.available | 2015-12-02T10:00:11Z | - |
dc.date.issued | 1985 | - |
dc.identifier.citation | IEEE Transactions on Instrumentation and Measurement, March 1985, vol. IM-34, no. 1 | en_US |
dc.identifier.issn | 00189456 | - |
dc.identifier.uri | https://hdl.handle.net/20.500.14279/1720 | - |
dc.description.abstract | A method is presented for measuring the difference between two low frequencies with high resolution. The method is based on multiplying the two incoming frequencies by a large factor and then using a BCD up/down counter to store and display the resulting frequency difference. | en_US |
dc.format | en_US | |
dc.language.iso | en | en_US |
dc.relation.ispartof | IEEE Transactions on Instrumentation and Measurement | en_US |
dc.rights | © 1985 IEEE | en_US |
dc.subject | Electronic circuits | en_US |
dc.subject | Counting | en_US |
dc.subject | Signal processing | en_US |
dc.subject | Electric measurements | en_US |
dc.title | A method for the precise measurement of the difference between two low frequencies | en_US |
dc.type | Article | en_US |
dc.affiliation | City University of New York | en |
dc.collaboration | University of Central Florida | en_US |
dc.subject.category | Electrical Engineering - Electronic Engineering - Information Engineering | en_US |
dc.country | United States | en_US |
dc.subject.field | Engineering and Technology | en_US |
dc.publication | Peer Reviewed | en_US |
dc.relation.conference | Transactions on Instrumentation and Measurement | en_US |
dc.identifier.doi | 10.1109/TIM.1985.4315268 | en_US |
dc.dept.handle | 123456789/54 | en |
cut.common.academicyear | 2019-2020 | en_US |
item.openairetype | article | - |
item.cerifentitytype | Publications | - |
item.languageiso639-1 | en | - |
item.fulltext | No Fulltext | - |
item.openairecristype | http://purl.org/coar/resource_type/c_6501 | - |
item.grantfulltext | none | - |
crisitem.author.dept | Department of Electrical Engineering, Computer Engineering and Informatics | - |
crisitem.author.faculty | Faculty of Engineering and Technology | - |
crisitem.author.orcid | 0000-0003-3486-538x | - |
crisitem.author.parentorg | Faculty of Engineering and Technology | - |
crisitem.journal.journalissn | 1557-9662 | - |
crisitem.journal.publisher | IEEE | - |
Appears in Collections: | Άρθρα/Articles |
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