Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.14279/1720
DC FieldValueLanguage
dc.contributor.authorKasparis, Takis-
dc.contributor.authorVoulgaris, Nicholas C.-
dc.contributor.authorHalkias, Christos C.-
dc.contributor.otherΚασπαρής, Τάκης-
dc.date.accessioned2013-02-19T15:24:54Zen
dc.date.accessioned2013-05-17T05:22:24Z-
dc.date.accessioned2015-12-02T10:00:11Z-
dc.date.available2013-02-19T15:24:54Zen
dc.date.available2013-05-17T05:22:24Z-
dc.date.available2015-12-02T10:00:11Z-
dc.date.issued1985-
dc.identifier.citationIEEE Transactions on Instrumentation and Measurement, March 1985, vol. IM-34, no. 1en_US
dc.identifier.issn00189456-
dc.identifier.urihttps://hdl.handle.net/20.500.14279/1720-
dc.description.abstractA method is presented for measuring the difference between two low frequencies with high resolution. The method is based on multiplying the two incoming frequencies by a large factor and then using a BCD up/down counter to store and display the resulting frequency difference.en_US
dc.formatpdfen_US
dc.language.isoenen_US
dc.relation.ispartofIEEE Transactions on Instrumentation and Measurementen_US
dc.rights© 1985 IEEEen_US
dc.subjectElectronic circuitsen_US
dc.subjectCountingen_US
dc.subjectSignal processingen_US
dc.subjectElectric measurementsen_US
dc.titleA method for the precise measurement of the difference between two low frequenciesen_US
dc.typeArticleen_US
dc.affiliationCity University of New Yorken
dc.collaborationUniversity of Central Floridaen_US
dc.subject.categoryElectrical Engineering - Electronic Engineering - Information Engineeringen_US
dc.countryUnited Statesen_US
dc.subject.fieldEngineering and Technologyen_US
dc.publicationPeer Revieweden_US
dc.relation.conferenceTransactions on Instrumentation and Measurementen_US
dc.identifier.doi10.1109/TIM.1985.4315268en_US
dc.dept.handle123456789/54en
cut.common.academicyear2019-2020en_US
item.grantfulltextnone-
item.openairecristypehttp://purl.org/coar/resource_type/c_6501-
item.fulltextNo Fulltext-
item.languageiso639-1en-
item.cerifentitytypePublications-
item.openairetypearticle-
crisitem.journal.journalissn1557-9662-
crisitem.journal.publisherIEEE-
crisitem.author.deptDepartment of Electrical Engineering, Computer Engineering and Informatics-
crisitem.author.facultyFaculty of Engineering and Technology-
crisitem.author.orcid0000-0003-3486-538x-
crisitem.author.parentorgFaculty of Engineering and Technology-
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