Please use this identifier to cite or link to this item:
https://hdl.handle.net/20.500.14279/1720| Title: | A method for the precise measurement of the difference between two low frequencies | Authors: | Kasparis, Takis Voulgaris, Nicholas C. Halkias, Christos C. |
metadata.dc.contributor.other: | Κασπαρής, Τάκης | Major Field of Science: | Engineering and Technology | Field Category: | Electrical Engineering - Electronic Engineering - Information Engineering | Keywords: | Electronic circuits;Counting;Signal processing;Electric measurements | Issue Date: | 1985 | Source: | IEEE Transactions on Instrumentation and Measurement, March 1985, vol. IM-34, no. 1 | Journal: | IEEE Transactions on Instrumentation and Measurement | Conference: | Transactions on Instrumentation and Measurement | Abstract: | A method is presented for measuring the difference between two low frequencies with high resolution. The method is based on multiplying the two incoming frequencies by a large factor and then using a BCD up/down counter to store and display the resulting frequency difference. | URI: | https://hdl.handle.net/20.500.14279/1720 | ISSN: | 00189456 | DOI: | 10.1109/TIM.1985.4315268 | Rights: | © 1985 IEEE | Type: | Article | Affiliation: | City University of New York | Affiliation : | University of Central Florida | Publication Type: | Peer Reviewed |
| Appears in Collections: | Άρθρα/Articles |
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