Παρακαλώ χρησιμοποιήστε αυτό το αναγνωριστικό για να παραπέμψετε ή να δημιουργήσετε σύνδεσμο προς αυτό το τεκμήριο: https://hdl.handle.net/20.500.14279/13945
Τίτλος: Fault tolerant maximum likelihood event localization in sensor networks using binary data
Συγγραφείς: Panayiotou, Christos G. 
Michaelides, Michalis P. 
Major Field of Science: Engineering and Technology
Field Category: Electrical Engineering - Electronic Engineering - Information Engineering
Λέξεις-κλειδιά: Binary data;Event localization;Fault tolerance;Maximum likelihood estimation;Wireless sensor networks
Ημερομηνία Έκδοσης: 16-Απρ-2009
Πηγή: IEEE Signal Processing Letters, 2009, vol. 16, no. 5, pp. 406-409
Volume: 16
Issue: 5
Start page: 406
End page: 409
Περιοδικό: IEEE Signal Processing Letters 
Περίληψη: This paper investigates Wireless Sensor Networks (WSNs) for achieving fault tolerant localization of an event using only binary information from the sensor nodes. In this context, faults occur due to various reasons and are manifested when a node outputs a wrong decision. The main contribution of this paper is to propose the Fault Tolerant Maximum Likelihood (FTML) estimator. FTML is compared against the Centroid (CE) and the classical Maximum Likelihood (ML) estimators and is shown to be significantly more fault tolerant. Moreover, this paper compares FTML against the SNAP (Subtract on Negative Add on Positive) algorithm and shows that in the presence of faults the two can achieve similar performance; FTML is slightly more accurate while SNAP is computationally less demanding and requires fewer parameters.
ISSN: 15582361
DOI: 10.1109/LSP.2009.2016481
Rights: © IEEE
Type: Article
Affiliation: University of Cyprus 
Publication Type: Peer Reviewed
Εμφανίζεται στις συλλογές:Άρθρα/Articles

CORE Recommender
Δείξε την πλήρη περιγραφή του τεκμηρίου

SCOPUSTM   
Citations

18
checked on 6 Νοε 2023

WEB OF SCIENCETM
Citations

14
Last Week
0
Last month
0
checked on 29 Οκτ 2023

Page view(s)

393
Last Week
0
Last month
31
checked on 14 Μαρ 2025

Google ScholarTM

Check

Altmetric


Όλα τα τεκμήρια του δικτυακού τόπου προστατεύονται από πνευματικά δικαιώματα