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dc.contributor.authorPanayiotou, Christos G.-
dc.contributor.authorMichaelides, Michalis P.-
dc.date.accessioned2019-05-31T09:31:22Z-
dc.date.available2019-05-31T09:31:22Z-
dc.date.issued2009-04-16-
dc.identifier.citationIEEE Signal Processing Letters, 2009, vol. 16, no. 5, pp. 406-409en_US
dc.identifier.issn15582361-
dc.description.abstractThis paper investigates Wireless Sensor Networks (WSNs) for achieving fault tolerant localization of an event using only binary information from the sensor nodes. In this context, faults occur due to various reasons and are manifested when a node outputs a wrong decision. The main contribution of this paper is to propose the Fault Tolerant Maximum Likelihood (FTML) estimator. FTML is compared against the Centroid (CE) and the classical Maximum Likelihood (ML) estimators and is shown to be significantly more fault tolerant. Moreover, this paper compares FTML against the SNAP (Subtract on Negative Add on Positive) algorithm and shows that in the presence of faults the two can achieve similar performance; FTML is slightly more accurate while SNAP is computationally less demanding and requires fewer parameters.en_US
dc.formatpdfen_US
dc.language.isoenen_US
dc.relation.ispartofIEEE Signal Processing Lettersen_US
dc.rights© IEEEen_US
dc.subjectBinary dataen_US
dc.subjectEvent localizationen_US
dc.subjectFault toleranceen_US
dc.subjectMaximum likelihood estimationen_US
dc.subjectWireless sensor networksen_US
dc.titleFault tolerant maximum likelihood event localization in sensor networks using binary dataen_US
dc.typeArticleen_US
dc.collaborationUniversity of Cyprusen_US
dc.subject.categoryElectrical Engineering - Electronic Engineering - Information Engineeringen_US
dc.journalsSubscriptionen_US
dc.countryCyprusen_US
dc.subject.fieldEngineering and Technologyen_US
dc.publicationPeer Revieweden_US
dc.identifier.doi10.1109/LSP.2009.2016481en_US
dc.contributor.orcid#NODATA#en
dc.contributor.orcid#NODATA#en
dc.relation.issue5en_US
dc.relation.volume16en_US
cut.common.academicyear2008-2009en_US
dc.identifier.spage406en_US
dc.identifier.epage409en_US
item.fulltextNo Fulltext-
item.languageiso639-1en-
item.grantfulltextnone-
item.openairecristypehttp://purl.org/coar/resource_type/c_6501-
item.cerifentitytypePublications-
item.openairetypearticle-
crisitem.journal.journalissn1558-2361-
crisitem.journal.publisherIEE-
crisitem.author.deptDepartment of Electrical Engineering, Computer Engineering and Informatics-
crisitem.author.facultyFaculty of Engineering and Technology-
crisitem.author.orcid0000-0002-0549-704X-
crisitem.author.parentorgFaculty of Engineering and Technology-
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