Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.14279/13945
Title: Fault tolerant maximum likelihood event localization in sensor networks using binary data
Authors: Panayiotou, Christos G. 
Michaelides, Michalis P. 
Major Field of Science: Engineering and Technology
Field Category: Electrical Engineering - Electronic Engineering - Information Engineering
Keywords: Binary data;Event localization;Fault tolerance;Maximum likelihood estimation;Wireless sensor networks
Issue Date: 16-Apr-2009
Source: IEEE Signal Processing Letters, 2009, vol. 16, no. 5, pp. 406-409
Volume: 16
Issue: 5
Start page: 406
End page: 409
Journal: IEEE Signal Processing Letters 
Abstract: This paper investigates Wireless Sensor Networks (WSNs) for achieving fault tolerant localization of an event using only binary information from the sensor nodes. In this context, faults occur due to various reasons and are manifested when a node outputs a wrong decision. The main contribution of this paper is to propose the Fault Tolerant Maximum Likelihood (FTML) estimator. FTML is compared against the Centroid (CE) and the classical Maximum Likelihood (ML) estimators and is shown to be significantly more fault tolerant. Moreover, this paper compares FTML against the SNAP (Subtract on Negative Add on Positive) algorithm and shows that in the presence of faults the two can achieve similar performance; FTML is slightly more accurate while SNAP is computationally less demanding and requires fewer parameters.
ISSN: 15582361
DOI: 10.1109/LSP.2009.2016481
Rights: © IEEE
Type: Article
Affiliation : University of Cyprus 
Publication Type: Peer Reviewed
Appears in Collections:Άρθρα/Articles

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