Please use this identifier to cite or link to this item:
https://hdl.handle.net/20.500.14279/1275| Title: | Structure, stability and bonding of ternary transition metal nitrides | Authors: | Matenoglou, G. M. Koutsokeras, Loukas E. Lekka, Christina E. Abadias, Gregory Kosmidis, C. Evangelakis, Georgios Antomiou Patsalas, Panos A. |
Major Field of Science: | Engineering and Technology | Field Category: | Materials Engineering | Keywords: | Ternary nitrides;Structure;Bonding;Stress;X-Ray diffraction;ab initio calculations | Issue Date: | 25-Dec-2009 | Source: | Surface and Coatings Technology, 2009, vol. 204, no. 6–7, pp. 911–914 | Volume: | 204 | Issue: | 6–7 | Start page: | 911 | End page: | 914 | Journal: | Surface and Coatings Technology | Abstract: | Ternary transition metal nitrides have gained special attention in an effort to improve further the properties of the corresponding binary compounds. In this work, we present a comparative study of a very wide range of ternary transition metal nitrides of the form: TixMe1-xN and TaxMe1-xN (Me = Ti,Zr,Hf,Nb,Ta,Mo,W) over the whole x range (0 < x < 1) grown by Pulsed Laser Deposition (PLD) and by Dual Ion Beam Sputtering. We study the stability of the rocksalt structure in all these films experimentally and theoretically through ab-initio calculations. We investigate the validity of Vegard's rule and the effect of growth-dependent stresses to the lattice constant | URI: | https://hdl.handle.net/20.500.14279/1275 | ISSN: | 02578972 | DOI: | 10.1016/j.surfcoat.2009.06.032 | Rights: | © Elsevier | Type: | Article | Affiliation: | University of Ioannina | Affiliation : | University of Ioannina Université de Poitiers |
Publication Type: | Peer Reviewed |
| Appears in Collections: | Άρθρα/Articles |
CORE Recommender
SCOPUSTM
Citations
53
checked on Nov 9, 2023
WEB OF SCIENCETM
Citations
50
48
Last Week
0
0
Last month
1
1
checked on Jun 29, 2023
Page view(s)
525
Last Week
0
0
Last month
1
1
checked on Nov 6, 2024
Google ScholarTM
Check
Altmetric
Items in KTISIS are protected by copyright, with all rights reserved, unless otherwise indicated.