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Publisher:  American Institute of Physics

Results 1-5 of 5 (Search time: 0.001 seconds).

Issue DateTitleAuthor(s)Journal
115-Mar-2002Characterization of reflectivity inversion, α- and β-phase transitions and nanostructure formation in hydrogen activated thin pd films on silicon based substratesKalli, Kyriacos ; Othonos, Andreas S. ; Christofidès, Constantinos Journal of Applied Physics 
2Sep-1999Nondestructive evaluation of metal contaminated silicon wafers using radiometric measurementsKalli, Kyriacos ; Christofidès, Constantinos ; Othonos, Andreas S. ; Tardiff, F. Journal of Applied Physics 
310-Nov-1998Temperature-induced reflectivity changes and activation of hydrogen sensitive optically thin palladium films on silicon oxideKalli, Kyriacos ; Othonos, Andreas S. ; Christofidès, Constantinos Review of Scientific Instruments 
421-Oct-1998Photomodulated thermoreflectance detection of hydrogen gas using optically thin palladium film on silicon oxideKalli, Kyriacos ; Othonos, Andreas S. ; Christofidès, Constantinos Review of Scientific Instruments 
51997Hydrogen gas detection via photothermal deflection measurementKalli, Kyriacos ; Othonos, Andreas S. ; Christofidès, Constantinos Review of Scientific Instruments