Please use this identifier to cite or link to this item:
https://hdl.handle.net/20.500.14279/1473
Title: | Photomodulated thermoreflectance detection of hydrogen gas using optically thin palladium film on silicon oxide | Authors: | Kalli, Kyriacos Othonos, Andreas S. Christofidès, Constantinos |
metadata.dc.contributor.other: | Καλλή, Κυριάκος | Major Field of Science: | Engineering and Technology | Field Category: | Physical Sciences | Keywords: | Photothermal spectroscopy;Palladium;Hydrogen;Chemisorption;Silicon oxide | Issue Date: | 21-Oct-1998 | Source: | Review of Scientific Instruments,1998, vol. 69, no. 3, pp. 1505-1511 | Volume: | 69 | Issue: | 3 | Start page: | 1505 | End page: | 1511 | Journal: | Review of Scientific Instruments | Abstract: | The sensitivity of various thicknesses of optically thin film palladium layers evaporated onto silicon oxide substrate is investigated in the presence of a hydrogen/air atmosphere at room temperature. The magnitude of the resulting reflectivity change is measured using an excite-probe technique, through laser excited photothermal modulation of a probe beam. This allows for the recovery of information from both the amplitude and phase channels of the hydrogen sensor output. Data indicates that concentrations of 0.1% hydrogen in the presence of a balanced air mixture and at room temperature may be measured with an 8 nm palladium film. The presence of inhomogeneities in the palladium layers leads to anomalous behavior. | URI: | https://hdl.handle.net/20.500.14279/1473 | ISSN: | 10897623 | DOI: | 10.1063/1.1148787 | Rights: | © American Institute of Physics | Type: | Article | Affiliation: | University of Cyprus | Affiliation : | University of Cyprus Linköping University |
Publication Type: | Peer Reviewed |
Appears in Collections: | Άρθρα/Articles |
CORE Recommender
SCOPUSTM
Citations
3
checked on Nov 9, 2023
WEB OF SCIENCETM
Citations
3
Last Week
0
0
Last month
0
0
checked on Oct 29, 2023
Page view(s) 20
454
Last Week
0
0
Last month
3
3
checked on Dec 21, 2024
Google ScholarTM
Check
Altmetric
Items in KTISIS are protected by copyright, with all rights reserved, unless otherwise indicated.