1. Ktisis Cyprus University of Technology
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Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.14279/1473
DC FieldValueLanguage
dc.contributor.authorKalli, Kyriacos-
dc.contributor.authorOthonos, Andreas S.-
dc.contributor.authorChristofidès, Constantinos-
dc.contributor.otherΚαλλή, Κυριάκος-
dc.date.accessioned2013-02-22T14:18:34Zen
dc.date.accessioned2013-05-17T05:22:46Z-
dc.date.accessioned2015-12-02T10:05:59Z-
dc.date.available2013-02-22T14:18:34Zen
dc.date.available2013-05-17T05:22:46Z-
dc.date.available2015-12-02T10:05:59Z-
dc.date.issued1998-10-21-
dc.identifier.citationReview of Scientific Instruments,1998, vol. 69, no. 3, pp. 1505-1511en_US
dc.identifier.issn10897623-
dc.identifier.urihttps://hdl.handle.net/20.500.14279/1473-
dc.description.abstractThe sensitivity of various thicknesses of optically thin film palladium layers evaporated onto silicon oxide substrate is investigated in the presence of a hydrogen/air atmosphere at room temperature. The magnitude of the resulting reflectivity change is measured using an excite-probe technique, through laser excited photothermal modulation of a probe beam. This allows for the recovery of information from both the amplitude and phase channels of the hydrogen sensor output. Data indicates that concentrations of 0.1% hydrogen in the presence of a balanced air mixture and at room temperature may be measured with an 8 nm palladium film. The presence of inhomogeneities in the palladium layers leads to anomalous behavior.en_US
dc.formatpdfen_US
dc.language.isoenen_US
dc.relation.ispartofReview of Scientific Instrumentsen_US
dc.rights© American Institute of Physicsen_US
dc.subjectPhotothermal spectroscopyen_US
dc.subjectPalladiumen_US
dc.subjectHydrogenen_US
dc.subjectChemisorptionen_US
dc.subjectSilicon oxideen_US
dc.titlePhotomodulated thermoreflectance detection of hydrogen gas using optically thin palladium film on silicon oxideen_US
dc.typeArticleen_US
dc.affiliationUniversity of Cyprusen
dc.collaborationUniversity of Cyprusen_US
dc.collaborationLinköping Universityen_US
dc.subject.categoryPhysical Sciencesen_US
dc.journalsSubscriptionen_US
dc.countrySwedenen_US
dc.countryCyprusen_US
dc.subject.fieldEngineering and Technologyen_US
dc.publicationPeer Revieweden_US
dc.identifier.doi10.1063/1.1148787en_US
dc.dept.handle123456789/54en
dc.relation.issue3en_US
dc.relation.volume69en_US
cut.common.academicyear1998-1999en_US
dc.identifier.spage1505en_US
dc.identifier.epage1511en_US
item.grantfulltextnone-
item.openairecristypehttp://purl.org/coar/resource_type/c_6501-
item.fulltextNo Fulltext-
item.languageiso639-1en-
item.cerifentitytypePublications-
item.openairetypearticle-
crisitem.journal.journalissn1089-7623-
crisitem.journal.publisherAmerican Institute of Physics-
crisitem.author.deptDepartment of Electrical Engineering, Computer Engineering and Informatics-
crisitem.author.facultyFaculty of Engineering and Technology-
crisitem.author.orcid0000-0003-4541-092X-
crisitem.author.parentorgFaculty of Engineering and Technology-
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