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Τίτλος: Possible approach for the simultaneous measurement of temperature and strain via first- and second-order diffraction from bragg grating sensors
Συγγραφείς: Kalli, Kyriacos 
Jackson, David A. 
Webb, David J. 
metadata.dc.contributor.other: Καλλή, Κυριάκος
Major Field of Science: Engineering and Technology
Field Category: Electrical Engineering - Electronic Engineering - Information Engineering
Λέξεις-κλειδιά: Bragg gratings;Diffraction gratings;Refractive index;Temperature measurements
Ημερομηνία Έκδοσης: Ιου-1995
Πηγή: (1995) Proceedings of SPIE - The International Society for Optical Engineering, 2507, pp. 190-198; Distributed and Multiplexed Fiber Optic Sensors V, 22-23 June 1995, Munich, Germany
Conference: Distributed and Multiplexed Fiber Optic Sensors V 
Περίληψη: A new method of discriminating between temperature and strain effects in fiber sensing, using a single, conventionally written in-fiber Bragg grating, is presented. The technique is based on a dual wavelength scheme and uses wavelength information from the first and second order diffraction from a single grating element when illuminated with light coinciding with the primary and secondary reflecting wavelengths. It is often assumed that during the grating growth the fiber core responds linearly to the incident UV radiation, thus resulting in a sinusoidal refractive index profile and only one discrete wavelength being reflected. In practice the recording process is nonlinear with continued exposure of the grating resulting in saturation of the index perturbation, this results in higher order grating reflections at roughly integer multiples of the primary reflected optical frequency, i.e. 1/integer multiples of the incident wavelength. The determination of the wavelength dependent strain and temperature coefficients at the primary and secondary reflections can be used to give independent temperature and strain measurements.
ISBN: 978-081941865-4
ISSN: 0277-786X
DOI: 10.1117/12.219620
Rights: © 1995 SPIE.
Type: Conference Papers
Affiliation: University of Kent at Canterbury 
Affiliation: University of Kent at Canterbury 
metadata.dc.description.sponsorship: SPIE - Int Soc for Opt Engineering, Bellingham, WA USA
Εμφανίζεται στις συλλογές:Δημοσιεύσεις σε συνέδρια /Conference papers or poster or presentation

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