Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.14279/23629
DC FieldValueLanguage
dc.contributor.authorLoizou, Christos P.-
dc.contributor.authorMurray, Víctor-
dc.contributor.authorPattichis, Marios S.-
dc.contributor.authorSeimenis, Ioannis-
dc.contributor.authorPantziaris, Marios-
dc.contributor.authorPattichis, Constantinos S.-
dc.date.accessioned2021-11-12T09:23:05Z-
dc.date.available2021-11-12T09:23:05Z-
dc.date.issued2011-01-
dc.identifier.citationIEEE Transactions on Information Technology in Biomedicine, 2011, vol. 15, no. 1, pp. 119 - 129en_US
dc.identifier.issn15580032-
dc.identifier.urihttps://hdl.handle.net/20.500.14279/23629-
dc.description.abstractThis study introduces the use of multiscale amplitude modulation-frequency modulation (AM-FM) texture analysis of multiple sclerosis (MS) using magnetic resonance (MR) images from brain. Clinically, there is interest in identifying potential associations between lesion texture and disease progression, and in relating texture features with relevant clinical indexes, such as the expanded disability status scale (EDSS). This longitudinal study explores the application of 2-D AM-FM analysis of brain white matter MS lesions to quantify and monitor disease load. To this end, MS lesions and normal-appearing white matter (NAWM) from MS patients, as well as normal white matter (NWM) from healthy volunteers, were segmented on transverse T2-weighted images obtained from serial brain MR imaging (MRI) scans (0 and 6-12 months). The instantaneous amplitude (IA), the magnitude of the instantaneous frequency (IF), and the IF angle were extracted from each segmented region at different scales. The findings suggest that AM-FM characteristics succeed in differentiating 1) between NWM and lesions; 2) between NAWM and lesions; and 3) between NWM and NAWM. A support vector machine (SVM) classifier succeeded in differentiating between patients that, two years after the initial MRI scan, acquired an EDSS ≤ 2 from those with EDSS > 2 (correct classification rate = 86%). The best classification results were obtained from including the combination of the low-scale IA and IF magnitude with the medium-scale IA. The AM-FM features provide complementary information to classical texture analysis features like the gray-scale median, contrast, and coarseness. The findings of this study provide evidence that AM-FM features may have a potential role as surrogate markers of lesion load in MS.en_US
dc.formatpdfen_US
dc.language.isoenen_US
dc.relation.ispartofIEEE Transactions on Information Technology in Biomedicineen_US
dc.rights© IEEEen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/*
dc.subjectAmplitude-modulation frequency-modulation (AM–FM)en_US
dc.subjectMagnetic resonance imaging (MRI)en_US
dc.subjectMultiple sclerosis (MS)en_US
dc.subjectTexture analysisen_US
dc.titleMultiscale amplitude-modulation frequency-modulation (AM-FM) texture analysis of multiple sclerosis in brain MRI imagesen_US
dc.typeArticleen_US
dc.collaborationIntercollegeen_US
dc.collaborationUniversity of New Mexicoen_US
dc.collaborationAyios Therissos Medical Diagnostic Centeren_US
dc.collaborationCyprus Institute of Neurology and Geneticsen_US
dc.collaborationUniversity of Cyprusen_US
dc.subject.categoryMedical Engineeringen_US
dc.journalsSubscriptionen_US
dc.countryCyprusen_US
dc.countryUnited Statesen_US
dc.subject.fieldEngineering and Technologyen_US
dc.publicationPeer Revieweden_US
dc.identifier.doi10.1109/TITB.2010.2091279en_US
dc.identifier.pmid21062681-
dc.identifier.scopus2-s2.0-78651286231-
dc.identifier.urlhttps://api.elsevier.com/content/abstract/scopus_id/78651286231-
dc.relation.issue1en_US
dc.relation.volume15en_US
cut.common.academicyear2010-2011en_US
dc.identifier.spage119en_US
dc.identifier.epage129en_US
item.fulltextNo Fulltext-
item.cerifentitytypePublications-
item.grantfulltextnone-
item.openairecristypehttp://purl.org/coar/resource_type/c_6501-
item.openairetypearticle-
item.languageiso639-1en-
crisitem.journal.journalissn1089-7771-
crisitem.journal.publisherIEEE-
crisitem.author.deptDepartment of Electrical Engineering, Computer Engineering and Informatics-
crisitem.author.facultyFaculty of Engineering and Technology-
crisitem.author.orcid0000-0003-1247-8573-
crisitem.author.parentorgFaculty of Engineering and Technology-
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