Please use this identifier to cite or link to this item:
https://hdl.handle.net/20.500.14279/1520
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kalli, Kyriacos | - |
dc.contributor.author | Othonos, Andreas S. | - |
dc.contributor.author | Christofidès, Constantinos | - |
dc.contributor.other | Καλλή, Κυριάκος | - |
dc.date.accessioned | 2013-02-22T14:29:28Z | en |
dc.date.accessioned | 2013-05-17T05:22:46Z | - |
dc.date.accessioned | 2015-12-02T10:07:38Z | - |
dc.date.available | 2013-02-22T14:29:28Z | en |
dc.date.available | 2013-05-17T05:22:46Z | - |
dc.date.available | 2015-12-02T10:07:38Z | - |
dc.date.issued | 1998-11-10 | - |
dc.identifier.citation | Review of Scientific Instruments, 1998, vol. 69, no. 9, pp. 3331-3338 | en_US |
dc.identifier.issn | 00346748 | - |
dc.identifier.uri | https://hdl.handle.net/20.500.14279/1520 | - |
dc.description.abstract | The optical properties of several thin metal film palladium-silicon oxide structures are examined at room temperature before and after annealing to 200°C and also at 90°C - in all cases in the presence of hydrogen gas. Multicycling sample activation is shown to occur in the presence of hydrogen at room temperature with an increase in reflectivity on exposure to hydrogen, in contrast to thicker 80 Å films. The reflectivity change increases with increasing film thickness (1-10Å). The surface activation at room temperature, before and after annealing to 200°C, is compared with the performance at 90°C, where it is shown that heat treatment strongly influences the behavior of the metal film. | en_US |
dc.format | en_US | |
dc.language.iso | en | en_US |
dc.relation.ispartof | Review of Scientific Instruments | en_US |
dc.rights | © American Institute of Physics | en_US |
dc.subject | Palladium | en_US |
dc.subject | Silicon oxide | en_US |
dc.subject | Temperature | en_US |
dc.subject | Hydrogen | en_US |
dc.title | Temperature-induced reflectivity changes and activation of hydrogen sensitive optically thin palladium films on silicon oxide | en_US |
dc.type | Article | en_US |
dc.affiliation | University of Cyprus | en |
dc.collaboration | University of Cyprus | en_US |
dc.collaboration | Linköping Institute of Technology | en_US |
dc.subject.category | Electrical Engineering - Electronic Engineering - Information Engineering | en_US |
dc.journals | Hybrid Open Access | en_US |
dc.country | Cyprus | en_US |
dc.country | Sweden | en_US |
dc.subject.field | Engineering and Technology | en_US |
dc.publication | Peer Reviewed | en_US |
dc.identifier.doi | 10.1063/1.1149116 | en_US |
dc.dept.handle | 123456789/54 | en |
dc.relation.issue | 9 | en_US |
dc.relation.volume | 69 | en_US |
cut.common.academicyear | 1998-1999 | en_US |
dc.identifier.spage | 3331 | en_US |
dc.identifier.epage | 3338 | en_US |
item.grantfulltext | none | - |
item.openairecristype | http://purl.org/coar/resource_type/c_6501 | - |
item.fulltext | No Fulltext | - |
item.languageiso639-1 | en | - |
item.cerifentitytype | Publications | - |
item.openairetype | article | - |
crisitem.journal.journalissn | 1089-7623 | - |
crisitem.journal.publisher | American Institute of Physics | - |
crisitem.author.dept | Department of Electrical Engineering, Computer Engineering and Informatics | - |
crisitem.author.faculty | Faculty of Engineering and Technology | - |
crisitem.author.orcid | 0000-0003-4541-092X | - |
crisitem.author.parentorg | Faculty of Engineering and Technology | - |
Appears in Collections: | Άρθρα/Articles |
CORE Recommender
SCOPUSTM
Citations
10
checked on Nov 9, 2023
WEB OF SCIENCETM
Citations
9
Last Week
0
0
Last month
0
0
checked on Oct 29, 2023
Page view(s) 50
437
Last Week
0
0
Last month
1
1
checked on Dec 21, 2024
Google ScholarTM
Check
Altmetric
Items in KTISIS are protected by copyright, with all rights reserved, unless otherwise indicated.