Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.14279/13941
Title: Integration of a concurrent signature monitoring mechanism in a system-on-a-chip
Authors: Kakarountas, Athanasios P.
Goutis, Costas E.
Michail, Harris 
Major Field of Science: Engineering and Technology
Field Category: Electrical Engineering - Electronic Engineering - Information Engineering
Keywords: BIST;Design-for-testability;On-line testing
Issue Date: Sep-2007
Source: Proceedings - 2007 International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2007, Article no. 4449490, pp. 47-51; 2007 International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2007 Rabat; Morocco; 2 September 2007 through 5 September 2007
Conference: International Conference on Design and Technology of Integrated Systems in Nanoscale 
Abstract: In this work, an IP infrastructure is presented that provides concurrent signature monitoring to the designed System-on-a-Chip (SoC). Such mechanisms ensure application code consistency and research focus integration inside high performance processor cores. A low-cost but very effective approach is offered, which has been successfully integrated in a prototype targeting safety critical applications. The advantages of the integration of this simple unit in a SoC and its characteristics are also presented. © 2007 IEEE.
ISBN: 978-142441278-5
DOI: 10.1109/DTIS.2007.4449490
Rights: © 2007 IEEE
Type: Conference Papers
Affiliation : University of Patras 
Funding: ST, Atmel,Altran Technologies, Altera
Publication Type: Peer Reviewed
Appears in Collections:Δημοσιεύσεις σε συνέδρια /Conference papers or poster or presentation

CORE Recommender
Show full item record

SCOPUSTM   
Citations 50

1
checked on Mar 14, 2024

Page view(s)

269
Last Week
0
Last month
4
checked on Nov 7, 2024

Google ScholarTM

Check

Altmetric


Items in KTISIS are protected by copyright, with all rights reserved, unless otherwise indicated.