Please use this identifier to cite or link to this item:
https://hdl.handle.net/20.500.14279/13941
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kakarountas, Athanasios P. | - |
dc.contributor.author | Goutis, Costas E. | - |
dc.contributor.author | Michail, Harris | - |
dc.date.accessioned | 2019-05-31T09:29:26Z | - |
dc.date.available | 2019-05-31T09:29:26Z | - |
dc.date.issued | 2007-09 | - |
dc.identifier.citation | Proceedings - 2007 International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2007, Article no. 4449490, pp. 47-51; 2007 International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2007 Rabat; Morocco; 2 September 2007 through 5 September 2007 | en_US |
dc.identifier.isbn | 978-142441278-5 | - |
dc.description.abstract | In this work, an IP infrastructure is presented that provides concurrent signature monitoring to the designed System-on-a-Chip (SoC). Such mechanisms ensure application code consistency and research focus integration inside high performance processor cores. A low-cost but very effective approach is offered, which has been successfully integrated in a prototype targeting safety critical applications. The advantages of the integration of this simple unit in a SoC and its characteristics are also presented. © 2007 IEEE. | en_US |
dc.description.sponsorship | ST, Atmel,Altran Technologies, Altera | en_US |
dc.language.iso | en | en_US |
dc.rights | © 2007 IEEE | en_US |
dc.subject | BIST | en_US |
dc.subject | Design-for-testability | en_US |
dc.subject | On-line testing | en_US |
dc.title | Integration of a concurrent signature monitoring mechanism in a system-on-a-chip | en_US |
dc.type | Conference Papers | en_US |
dc.collaboration | University of Patras | en_US |
dc.subject.category | Electrical Engineering - Electronic Engineering - Information Engineering | en_US |
dc.country | Greece | en_US |
dc.subject.field | Engineering and Technology | en_US |
dc.publication | Peer Reviewed | en_US |
dc.relation.conference | International Conference on Design and Technology of Integrated Systems in Nanoscale | en_US |
dc.identifier.doi | 10.1109/DTIS.2007.4449490 | en_US |
dc.identifier.scopus | 2-s2.0-48349128515 | en |
dc.identifier.url | https://api.elsevier.com/content/abstract/scopus_id/48349128515 | en |
dc.contributor.orcid | #NODATA# | en |
dc.contributor.orcid | #NODATA# | en |
dc.contributor.orcid | #NODATA# | en |
cut.common.academicyear | 2007-2008 | en_US |
item.grantfulltext | none | - |
item.openairecristype | http://purl.org/coar/resource_type/c_c94f | - |
item.fulltext | No Fulltext | - |
item.languageiso639-1 | en | - |
item.cerifentitytype | Publications | - |
item.openairetype | conferenceObject | - |
crisitem.author.dept | Department of Electrical Engineering, Computer Engineering and Informatics | - |
crisitem.author.faculty | Faculty of Engineering and Technology | - |
crisitem.author.orcid | 0000-0002-8299-8737 | - |
crisitem.author.parentorg | Faculty of Engineering and Technology | - |
Appears in Collections: | Δημοσιεύσεις σε συνέδρια /Conference papers or poster or presentation |
CORE Recommender
SCOPUSTM
Citations
50
1
checked on Mar 14, 2024
Page view(s)
275
Last Week
0
0
Last month
10
10
checked on Dec 26, 2024
Google ScholarTM
Check
Altmetric
Items in KTISIS are protected by copyright, with all rights reserved, unless otherwise indicated.