1. Ktisis Cyprus University of Technology
  2. Cyprus University of Technology (Research Output)
  3. Δημοσιεύσεις σε συνέδρια /Conference papers or poster or presentation
Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.14279/13416
DC FieldValueLanguage
dc.contributor.authorMohanram, Sat-
dc.contributor.authorDarwish, Mohamed-
dc.contributor.authorMarouchos, Christos-
dc.contributor.otherΜαρούχος, Χρίστος-
dc.date.accessioned2019-04-02T08:54:48Z-
dc.date.available2019-04-02T08:54:48Z-
dc.date.issued2018-11-
dc.identifier.citation53rd International Universities Power Engineering Conference, 2018, 4-7 September, Glasgow, United Kingdom;en_US
dc.identifier.urihttps://hdl.handle.net/20.500.14279/13416-
dc.description.abstractSemiconductor devices are subjected to elevated levels of stresses when used at high voltage high current and temperature applications. This stress is mainly due to hard switching which is proportional to the switching frequency. This paper presents methods used to remove this energy to prevent expensive switch damage due to overheating and high dv/dt oscillations. In confirmation of the research title, the process in the determination of 'RC' in snubber circuits has been proven by OrCAD optimisation and presented.en_US
dc.formatpdfen_US
dc.language.isoenen_US
dc.rights© 2018 IEEE.en_US
dc.subjectHard switchingen_US
dc.subjectInput-output parametersen_US
dc.subjectSimulationen_US
dc.subjectSnubber Circuit (RC)en_US
dc.subjectSwitching frequencyen_US
dc.subjectLossesen_US
dc.subjectTC Optimizationsen_US
dc.titleOptimisation and Simulation of RC Time Constants in Snubber Circuitsen_US
dc.typeConference Papersen_US
dc.collaborationBrunel Universityen_US
dc.collaborationCyprus University of Technologyen_US
dc.subject.categoryElectrical Engineering - Electronic Engineering - Information Engineeringen_US
dc.countryCyprusen_US
dc.countryUnited Kingdomen_US
dc.subject.fieldEngineering and Technologyen_US
dc.relation.conferenceInternational Universities Power Engineering Conferenceen_US
dc.identifier.doi10.1109/UPEC.2018.8542111en_US
cut.common.academicyear2018-2019en_US
item.fulltextNo Fulltext-
item.cerifentitytypePublications-
item.grantfulltextnone-
item.openairecristypehttp://purl.org/coar/resource_type/c_c94f-
item.openairetypeconferenceObject-
item.languageiso639-1en-
crisitem.author.deptDepartment of Electrical Engineering, Computer Engineering and Informatics-
crisitem.author.facultyFaculty of Engineering and Technology-
crisitem.author.parentorgFaculty of Engineering and Technology-
Appears in Collections:Δημοσιεύσεις σε συνέδρια /Conference papers or poster or presentation
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