Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.14279/10927
Title: Deep learning with t-exponential Bayesian kitchen sinks
Authors: Partaourides, Harris 
Chatzis, Sotirios P. 
Major Field of Science: Engineering and Technology
Field Category: Electrical Engineering - Electronic Engineering - Information Engineering
Keywords: Random kitchen sinks;Student's-t distribution;t-divergence;Variational bayes
Issue Date: 15-May-2018
Source: Expert Systems with Applications, 2018, vol. 98, pp. 84-92
Volume: 98
Start page: 84
End page: 92
Journal: Expert systems with applications 
Abstract: Bayesian learning has been recently considered as an effective means of accounting for uncertainty in trained deep network parameters. This is of crucial importance when dealing with small or sparse training datasets. On the other hand, shallow models that compute weighted sums of their inputs, after passing them through a bank of arbitrary randomized nonlinearities, have been recently shown to enjoy good test error bounds that depend on the number of nonlinearities. Inspired from these advances, in this paper we examine novel deep network architectures, where each layer comprises a bank of arbitrary nonlinearities, linearly combined using multiple alternative sets of weights. We effect model training by means of approximate inference based on a t-divergence measure; this generalizes the Kullback–Leibler divergence in the context of the t-exponential family of distributions. We adopt the t-exponential family since it can more flexibly accommodate real-world data, that entail outliers and distributions with fat tails, compared to conventional Gaussian model assumptions. We extensively evaluate our approach using several challenging benchmarks, and provide comparative results to related state-of-the-art techniques.
URI: https://hdl.handle.net/20.500.14279/10927
ISSN: 09574174
DOI: 10.1016/j.eswa.2018.01.013
Rights: © Elsevier
Type: Article
Affiliation : Cyprus University of Technology 
Publication Type: Peer Reviewed
Appears in Collections:Άρθρα/Articles

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