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Results 1-4 of 4 (Search time: 0.006 seconds).

Issue DateTitleAuthor(s)
1Sep-1999Nondestructive evaluation of metal contaminated silicon wafers using radiometric measurementsKalli, Kyriacos ; Christofidès, Constantinos ; Othonos, Andreas S. ; Tardiff, F. 
210-Nov-1998Temperature-induced reflectivity changes and activation of hydrogen sensitive optically thin palladium films on silicon oxideKalli, Kyriacos ; Othonos, Andreas S. ; Christofidès, Constantinos 
321-Oct-1998Photomodulated thermoreflectance detection of hydrogen gas using optically thin palladium film on silicon oxideKalli, Kyriacos ; Othonos, Andreas S. ; Christofidès, Constantinos 
41997Hydrogen gas detection via photothermal deflection measurementKalli, Kyriacos ; Othonos, Andreas S. ; Christofidès, Constantinos