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		Issue Date	Title	Author(s)	Journal
	1	3-Nov-2008	Influence of thermal processing on the electrical characteristics of MOS capacitors on strained-silicon substrates	Kelaidis, N. ; Ioannou-Sougleridis, Vassilios ; Tsamis, Christos ; Krontiras, Christoforos A. ; Georga, Stavroula N. ; Kellerman, Bruce K. ; Seacrist, Mike R. ; Skarlatos, Dimitrios	Thin Solid Films