MEMC Electronic Materials

Organization name
MEMC Electronic Materials


Results 1-1 of 1 (Search time: 0.001 seconds).

Issue DateTitleAuthor(s)
13-Nov-2008Influence of thermal processing on the electrical characteristics of MOS capacitors on strained-silicon substratesKelaidis, N. ; Ioannou-Sougleridis, Vassilios ; Tsamis, Christos ; Krontiras, Christoforos A. ; Georga, Stavroula N. ; Kellerman, Bruce K. ; Seacrist, Mike R. ; Skarlatos, Dimitrios