Events Annual IEEE/ACM International Symposium on Microarchitecture

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Annual IEEE/ACM International Symposium on Microarchitecture

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		Issue Date	Title	Author(s)
	1	1-Dec-2013	Use it or lose it: Wear-out and lifetime in future chip multiprocessors	Kim, Hyungjun ; Vitkovskiy, Arseniy ; Gratz, Paul V. ; Soteriou, Vassos