Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.14279/9334
DC FieldValueLanguage
dc.contributor.authorPhotiou, Demetris-
dc.contributor.authorPanagiotopoulos, Nikolaos T.-
dc.contributor.authorKoutsokeras, Loukas E.-
dc.contributor.authorEvangelakis, Georgios Antomiou-
dc.contributor.authorConstantinides, Georgios-
dc.contributor.otherΦωτίου, Δημήτρης-
dc.contributor.otherΚουτσοκέρας, Λούκας-
dc.contributor.otherΚωνσταντινίδης, Γιώργος-
dc.date.accessioned2017-01-31T12:28:39Z-
dc.date.available2017-01-31T12:28:39Z-
dc.date.issued2016-09-25-
dc.identifier.citationSurface and Coatings Technology, 2016, vol. 302, pp. 310-319en_US
dc.identifier.issn02578972-
dc.identifier.urihttps://hdl.handle.net/20.500.14279/9334-
dc.description.abstractTitanium niobium (Ti − Nb) films, covering a broad spectrum of compositions, are deposited on silicon substrates using magnetron co-sputtering. The morphological, crystallographic and mechanical characteristics of the films are studied using scanning electron microscopy (SEM), X-ray diffraction (XRD) and nanoindentation, respectively. The Ti − Nb films exhibit a columnar growth and contain porosity at volumetric percentages of 2–14 vol%. Furthermore, it is observed that the allotropic β − Ti phase can be stabilized at room temperature for Nb compositions beyond 20 at%. Phase composition and microstructural details have subsequent implications on the mechanical properties of the films which are studied experimentally and micromechanically. Among the tested compositions, Ti85Nb15 exhibits the lowest elastic modulus. The obtained structure–property relations could serve as a tool for material optimization.en_US
dc.formatpdfen_US
dc.language.isoenen_US
dc.relation.ispartofSurface and Coatings Technologyen_US
dc.rights© Elsevieren_US
dc.subjectElectron microscopyen_US
dc.subjectNanoindentationen_US
dc.subjectTitanium alloysen_US
dc.subjectX-ray diffractionen_US
dc.subjectβ − Ti poromechanicsen_US
dc.titleMicrostructure and nanomechanical properties of magnetron sputtered Ti − Nb filmsen_US
dc.typeArticleen_US
dc.doihttp://dx.doi.org/10.1016/j.surfcoat.2016.06.014en_US
dc.collaborationCyprus University of Technologyen_US
dc.collaborationUniversity of Ioanninaen_US
dc.collaborationUniversité Grenoble Alpesen_US
dc.collaborationCNRSen_US
dc.subject.categoryNano-Technologyen_US
dc.journalsSubscriptionen_US
dc.countryCyprusen_US
dc.countryGreeceen_US
dc.countryFranceen_US
dc.subject.fieldEngineering and Technologyen_US
dc.publicationPeer Revieweden_US
dc.identifier.doi10.1016/j.surfcoat.2016.06.014en_US
dc.relation.volume302en_US
cut.common.academicyear2016-2017en_US
dc.identifier.spage310en_US
dc.identifier.epage319en_US
item.fulltextNo Fulltext-
item.cerifentitytypePublications-
item.grantfulltextnone-
item.openairecristypehttp://purl.org/coar/resource_type/c_6501-
item.openairetypearticle-
item.languageiso639-1en-
crisitem.journal.journalissn0257-8972-
crisitem.journal.publisherElsevier-
crisitem.author.deptDepartment of Mechanical Engineering and Materials Science and Engineering-
crisitem.author.deptDepartment of Mechanical Engineering and Materials Science and Engineering-
crisitem.author.deptDepartment of Mechanical Engineering and Materials Science and Engineering-
crisitem.author.facultyFaculty of Engineering and Technology-
crisitem.author.facultyFaculty of Engineering and Technology-
crisitem.author.facultyFaculty of Engineering and Technology-
crisitem.author.orcid0000-0003-4143-0085-
crisitem.author.orcid0000-0003-1979-5176-
crisitem.author.parentorgFaculty of Engineering and Technology-
crisitem.author.parentorgFaculty of Engineering and Technology-
crisitem.author.parentorgFaculty of Engineering and Technology-
Appears in Collections:Άρθρα/Articles
CORE Recommender
Show simple item record

SCOPUSTM   
Citations

27
checked on Nov 9, 2023

WEB OF SCIENCETM
Citations 50

23
Last Week
0
Last month
1
checked on Oct 29, 2023

Page view(s)

388
Last Week
1
Last month
9
checked on May 12, 2024

Google ScholarTM

Check

Altmetric


Items in KTISIS are protected by copyright, with all rights reserved, unless otherwise indicated.