1. Ktisis Cyprus University of Technology
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Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.14279/9120
DC FieldValueLanguage
dc.contributor.authorZhidkov, Ivan S.-
dc.contributor.authorMcLeod, John A.-
dc.contributor.authorKurmaev, Ernst Z.-
dc.contributor.authorKorotin, Michael A.-
dc.contributor.authorKukharenko, Andrey I.-
dc.contributor.authorSavva, Achilleas-
dc.contributor.authorChoulis, Stelios A.-
dc.contributor.authorKorotin, Dm M.-
dc.contributor.authorCholakh, Seif O.-
dc.contributor.otherΣάββα, Αχιλλέας-
dc.contributor.otherΧούλης, Στέλιος-
dc.date.accessioned2017-01-18T15:13:04Z-
dc.date.available2017-01-18T15:13:04Z-
dc.date.issued2016-07-11-
dc.identifier.citationApplied Physics Letters, 2016, vol. 109, no. 2en_US
dc.identifier.issn10773118-
dc.identifier.urihttps://hdl.handle.net/20.500.14279/9120-
dc.description.abstractWe study the low-temperature solution processed TiOx films and device structures using core level and valence X-ray photoelectron spectroscopy (XPS) and electronic structure calculations. We are able to correlate the fraction of Ti3+ present as obtained from Ti 2p core level XPS with the intensity of the defect states that appear within the band gap as observed with our valence XPS. Constructing an operating inverted organic photovoltaic (OPV) using the TiOx film as an electron selective contact may increase the fraction of Ti3+ present. We provide evidence that the number of charge carriers in TiOx can be significantly varied and this might influence the performance of inverted OPVs.en_US
dc.formatpdfen_US
dc.language.isoenen_US
dc.relation.ispartofApplied Physics Lettersen_US
dc.rights© American Institute of Physicsen_US
dc.subjectOrganic photovoltaic (OPV)en_US
dc.subjectElectronic structureen_US
dc.subjectEnergy gapen_US
dc.titleThe appearance of Ti3+ states in solution-processed TiOx buffer layers in inverted organic photovoltaicsen_US
dc.typeArticleen_US
dc.collaborationUral Federal Universityen_US
dc.collaborationSoochow Universityen_US
dc.collaborationCyprus University of Technologyen_US
dc.subject.categoryMechanical Engineeringen_US
dc.journalsSubscriptionen_US
dc.countryRussiaen_US
dc.countryChinaen_US
dc.countryCyprusen_US
dc.subject.fieldEngineering and Technologyen_US
dc.publicationPeer Revieweden_US
dc.identifier.doi10.1063/1.4958892en_US
dc.relation.issue2en_US
dc.relation.volume109en_US
cut.common.academicyear2015-2016en_US
item.fulltextWith Fulltext-
item.openairecristypehttp://purl.org/coar/resource_type/c_6501-
item.openairetypearticle-
item.grantfulltextopen-
item.languageiso639-1en-
item.cerifentitytypePublications-
crisitem.journal.journalissn1077-3118-
crisitem.journal.publisherAmerican Institute of Physics-
crisitem.author.deptDepartment of Mechanical Engineering and Materials Science and Engineering-
crisitem.author.deptDepartment of Mechanical Engineering and Materials Science and Engineering-
crisitem.author.facultyFaculty of Engineering and Technology-
crisitem.author.facultyFaculty of Engineering and Technology-
crisitem.author.orcid0000-0001-6454-5788-
crisitem.author.orcid0000-0002-7899-6296-
crisitem.author.parentorgFaculty of Engineering and Technology-
crisitem.author.parentorgFaculty of Engineering and Technology-
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