Please use this identifier to cite or link to this item:
https://hdl.handle.net/20.500.14279/8681
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Boucher, Alexandre | - |
dc.contributor.author | Kyriakidis, Phaedon | - |
dc.contributor.other | Κυριακίδης, Φαίδων | - |
dc.date.accessioned | 2016-07-15T11:19:58Z | - |
dc.date.available | 2016-07-15T11:19:58Z | - |
dc.date.issued | 2007-08 | - |
dc.identifier.citation | Photogrammetric Engineering & Remote Sensing, 2007, vol. 73, no. 8, pp. 913–921 | en_US |
dc.identifier.issn | 00991112 | - |
dc.identifier.uri | https://hdl.handle.net/20.500.14279/8681 | - |
dc.description.abstract | Super-resolution or sub-pixel class mapping is the task of providing fine spatial resolution maps of, for example, landcover classes, from satellite sensor measurements obtained at a coarser spatial resolution. Often, the only information available consists of coarse class fraction data, typically obtained through spectral unmixing. This paper shows how to integrate, in addition to such coarse fractions, class labels at a set of fine pixels obtained independent of the satellite sensor measurements. The integration of such fine spatial resolution information is achieved within the Indicator Kriging formalism in either a prediction or simulation mode. The spatial dissimilarity or texture of class labels at the fine (target) resolution is quantified in a non-parametric way from an analog scene using a set of experimental indicator semivariogram maps. The output of the proposed procedure consists of maps of probabilities of class occurrence, or of a series of simulated class maps characterizing the inherent spatial uncertainty in the super-resolution mapping process. | en_US |
dc.format | en_US | |
dc.language.iso | en | en_US |
dc.relation.ispartof | Photogrammetric Engineering & Remote Sensing | en_US |
dc.rights | © American Society for Photogrammetry and Remote Sensing | en_US |
dc.subject | Super-resolution | en_US |
dc.subject | Sub-pixel class | en_US |
dc.subject | Mapping | en_US |
dc.subject | Land-cover classes | en_US |
dc.subject | Satellite sensor | en_US |
dc.subject | Measurements | en_US |
dc.title | Integrating fine scale information in super-resolution land cover mapping | en_US |
dc.type | Article | en_US |
dc.collaboration | Stanford University | en_US |
dc.collaboration | University of California | en_US |
dc.subject.category | Environmental Biotechnology | en_US |
dc.journals | Subscription | en_US |
dc.country | United States | en_US |
dc.subject.field | Engineering and Technology | en_US |
dc.publication | Peer Reviewed | en_US |
dc.identifier.doi | 10.14358/PERS.73.8.913 | en_US |
dc.dept.handle | 123456789/54 | en |
dc.relation.issue | 8 | en_US |
dc.relation.volume | 73 | en_US |
cut.common.academicyear | 2006-2007 | en_US |
dc.identifier.spage | 913 | en_US |
dc.identifier.epage | 921 | en_US |
item.openairetype | article | - |
item.cerifentitytype | Publications | - |
item.fulltext | No Fulltext | - |
item.grantfulltext | none | - |
item.openairecristype | http://purl.org/coar/resource_type/c_6501 | - |
item.languageiso639-1 | en | - |
crisitem.author.dept | Department of Civil Engineering and Geomatics | - |
crisitem.author.faculty | Faculty of Engineering and Technology | - |
crisitem.author.orcid | 0000-0003-4222-8567 | - |
crisitem.author.parentorg | Faculty of Engineering and Technology | - |
Appears in Collections: | Άρθρα/Articles |
CORE Recommender
SCOPUSTM
Citations
29
checked on Nov 9, 2023
WEB OF SCIENCETM
Citations
10
28
Last Week
0
0
Last month
0
0
checked on Nov 1, 2023
Page view(s)
306
Last Week
2
2
Last month
3
3
checked on Feb 1, 2025
Google ScholarTM
Check
Altmetric
Items in KTISIS are protected by copyright, with all rights reserved, unless otherwise indicated.