Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.14279/4111
DC FieldValueLanguage
dc.contributor.authorVitkovskiy, Arseniy-
dc.contributor.authorNicopoulos, Chrysostomos-
dc.contributor.authorSoteriou, Vassos-
dc.date.accessioned2013-02-15T10:44:02Zen
dc.date.accessioned2013-05-17T10:30:21Z-
dc.date.accessioned2015-12-09T11:29:58Z-
dc.date.available2013-02-15T10:44:02Zen
dc.date.available2013-05-17T10:30:21Z-
dc.date.available2015-12-09T11:29:58Z-
dc.date.issued2012-08-
dc.identifier.citationIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2012, vol. 31, no. 8, pp. 1235 - 1248en_US
dc.identifier.issn02780070-
dc.identifier.urihttps://hdl.handle.net/20.500.14279/4111-
dc.description.abstractThe rapid scaling of silicon technology has enabled massive transistor integration densities. Nanometer feature sizes, however, are marred by increasing variability and susceptibility to wear-out. Billion-transistor designs, such as chip multiprocessors (CMPs), are especially vulnerable to defects. CMPs rely on a network-on-chip for all their communication needs. A single link failure within this on-chip fabric can impede, halt, or even deadlock, intertile communication, which can render the entire chip multiprocessor useless. In this paper, we present a technique capable of handling very large numbers of permanent wire failures that occur in parallel links either at manufacture-time or at runtime (dynamically). As opposed to marking an entire parallel link as faulty, whenever some wires fail, the proposed methodology employs these partially-faulty links (PFLs) to continue the transfer of information-albeit at a gracefully degraded mode-in order to maintain network connectivity. Furthermore, the presented technique can designate PFLs as fully-faulty when several wires fail, by utilizing appropriate routing algorithms that bypass nonoperational links, while still maintaining load-balance in the vicinity of PFLs. The proposed scheme employs architectural support within the on-chip routers to detect link failures and enable reconfiguration at the granularity of individual wires. Hardware synthesis confirms the low-cost nature of the proposed architecture, and full-system simulations using both synthetic network traffic and real workloads demonstrate its efficacyen_US
dc.formatpdfen_US
dc.language.isoenen_US
dc.relation.ispartofIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systemsen_US
dc.rights© Copyright 2012 IEEEen_US
dc.subjectRouters (Computer networks)en_US
dc.subjectComputer architectureen_US
dc.subjectComputer scienceen_US
dc.subjectNetworks on a chipen_US
dc.subjectAlgorithmsen_US
dc.subjectMicroprocessorsen_US
dc.subjectFault tolerance (Engineering)en_US
dc.titleA Dynamically Adjusting Gracefully Degrading Link-level Fault-tolerant Mechanism for NoCsen_US
dc.typeArticleen_US
dc.collaborationCyprus University of Technologyen_US
dc.subject.categoryElectrical Engineering - Electronic Engineering - Information Engineeringen_US
dc.journalsSubscriptionen_US
dc.reviewpeer reviewed-
dc.countryCyprusen_US
dc.subject.fieldEngineering and Technologyen_US
dc.publicationPeer Revieweden_US
dc.identifier.doi10.1109/TCAD.2012.2188801en_US
dc.dept.handle123456789/134en
dc.relation.issue8en_US
dc.relation.volume31en_US
cut.common.academicyear2011-2012en_US
dc.identifier.spage1235en_US
dc.identifier.epage1248en_US
item.fulltextNo Fulltext-
item.cerifentitytypePublications-
item.grantfulltextnone-
item.openairecristypehttp://purl.org/coar/resource_type/c_6501-
item.openairetypearticle-
item.languageiso639-1en-
crisitem.journal.journalissn0278-0070-
crisitem.journal.publisherIEEE-
crisitem.author.deptDepartment of Electrical Engineering, Computer Engineering and Informatics-
crisitem.author.deptDepartment of Electrical Engineering, Computer Engineering and Informatics-
crisitem.author.facultyFaculty of Engineering and Technology-
crisitem.author.facultyFaculty of Engineering and Technology-
crisitem.author.orcid0000-0002-2818-0459-
crisitem.author.parentorgFaculty of Engineering and Technology-
crisitem.author.parentorgFaculty of Engineering and Technology-
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