Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.14279/33227
DC FieldValueLanguage
dc.contributor.authorAntoniou, Marina-
dc.contributor.authorLophitis, Neophytos-
dc.contributor.authorUdrea, Florin-
dc.contributor.authorBauer, Friedhelm-
dc.contributor.authorVemulapati, Umamaheswara Reddy-
dc.contributor.authorBadstuebner, Uwe-
dc.date.accessioned2024-11-29T08:08:17Z-
dc.date.available2024-11-29T08:08:17Z-
dc.date.issued2017-06-22-
dc.identifier.citationIEEE Electron Device Letters, 2017, vol. 38, iss. 8, pp. 1063 - 1066en_US
dc.identifier.urihttps://hdl.handle.net/20.500.14279/33227-
dc.description.abstractIn this letter, we present the "anode-side" SuperJunction trench field stop+ IGBT concept with drift region SuperJunction pillars placed at the anode side of the structure rather than the cathode side. The extent of the pillars toward the cathode side is shown to pose a tradeoff between fabrication technology capabilities (and cost) versus the device performance, by extensive TCAD simulations. The proposed device structure simplifies the fabrication requirements by steering clear from the need to align the cathode side features with the SuperJunction pillars. It also provides an extra degree of freedom by decoupling the cathode design from the SuperJunction structure. Additionally, the presence of SuperJunction technology in the drift region of the "anode-side" SJ Trench FS+ IGBT results in 20% reduction of ON-state losses for the same switching energy losses or, up to 30% switching losses reduction for the same ON-state voltage drop, compared with a 1.2-kV breakdown rated conventional FS+ Trench IGBT device. The proposed structure also finds applications in reverse conducting IGBTs, where a reduced snapback can be achieved, and in MOS-controlled thyristor devices.en_US
dc.formatpdfen_US
dc.language.isoenen_US
dc.relation.ispartofIEEE Electron Device Lettersen_US
dc.rightsAttribution-NonCommercial-NoDerivatives 4.0 Internationalen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/*
dc.subjectfield stopen_US
dc.subjectInsulated gate bipolar transistoren_US
dc.subjectpoint injectionen_US
dc.subjectSuperJunction (SJ)en_US
dc.titleOn the Investigation of the "anode Side" SuperJunction IGBT Design Concepten_US
dc.typeArticleen_US
dc.collaborationUniversity of Cambridgeen_US
dc.collaborationCoventry Universityen_US
dc.collaborationCorporate Research ABB Switzerland Ltden_US
dc.journalsSubscriptionen_US
dc.countryUnited Kingdomen_US
dc.countrySwitzerlanden_US
dc.subject.fieldEngineering and Technologyen_US
dc.publicationPeer Revieweden_US
dc.identifier.doi10.1109/LED.2017.2718619en_US
dc.identifier.scopus2-s2.0-85021816062-
dc.identifier.urlhttps://api.elsevier.com/content/abstract/scopus_id/85021816062-
dc.relation.issue8en_US
dc.relation.volume38en_US
cut.common.academicyear2016-2017en_US
dc.identifier.spage1063en_US
dc.identifier.epage1066en_US
item.grantfulltextnone-
item.openairecristypehttp://purl.org/coar/resource_type/c_6501-
item.fulltextNo Fulltext-
item.languageiso639-1en-
item.cerifentitytypePublications-
item.openairetypearticle-
crisitem.author.deptDepartment of Electrical Engineering, Computer Engineering and Informatics-
crisitem.author.facultyFaculty of Engineering and Technology-
crisitem.author.orcid0000-0002-0901-0876-
crisitem.author.parentorgFaculty of Engineering and Technology-
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