Please use this identifier to cite or link to this item:
https://hdl.handle.net/20.500.14279/2925| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Choulis, Stelios A. | en |
| dc.contributor.author | Tomić, Stanko S. | en |
| dc.contributor.author | Fehse, Robin | en |
| dc.contributor.other | Χούλης, Στέλιος Α. | - |
| dc.date.accessioned | 2013-03-06T15:29:12Z | en |
| dc.date.accessioned | 2013-05-17T05:34:11Z | - |
| dc.date.accessioned | 2015-12-02T12:26:57Z | - |
| dc.date.available | 2013-03-06T15:29:12Z | en |
| dc.date.available | 2013-05-17T05:34:11Z | - |
| dc.date.available | 2015-12-02T12:26:57Z | - |
| dc.date.issued | 2002 | en |
| dc.identifier.citation | IEEE 18th international semiconductor laser conference, 2002, Pages 41-42 | en |
| dc.identifier.isbn | 0-7803-7598-X | en |
| dc.identifier.uri | https://hdl.handle.net/20.500.14279/2925 | - |
| dc.description.abstract | By measuring the spontaneous emission from normally operating ∼1.3 μm GaInNAs/GaAs-based lasers we have quantitatively determined the variation of each of the current paths present in the devices as a function of temperature from 130 K to 370 K | en |
| dc.language.iso | en | en |
| dc.rights | © IEEE | en |
| dc.subject | Electrons | en |
| dc.subject | Nitrogen | en |
| dc.subject | Quantum wells | en |
| dc.subject | Resonance | en |
| dc.subject | Gallium arsenide | en |
| dc.subject | Indium compounds | en |
| dc.title | Experimental and theoretical analysis of the recombination processes in GaInNs 1.3 μm lasers | en |
| dc.type | Book Chapter | en |
| dc.affiliation | University of Surrey | en |
| dc.identifier.doi | 10.1109/ISLC.2002.1041108 | en |
| dc.dept.handle | 123456789/54 | en |
| item.openairetype | bookPart | - |
| item.cerifentitytype | Publications | - |
| item.languageiso639-1 | en | - |
| item.fulltext | No Fulltext | - |
| item.openairecristype | http://purl.org/coar/resource_type/c_3248 | - |
| item.grantfulltext | none | - |
| crisitem.author.dept | Department of Mechanical Engineering and Materials Science and Engineering | - |
| crisitem.author.faculty | Faculty of Engineering and Technology | - |
| crisitem.author.orcid | 0000-0002-7899-6296 | - |
| crisitem.author.parentorg | Faculty of Engineering and Technology | - |
| Appears in Collections: | Κεφάλαια βιβλίων/Book chapters | |
CORE Recommender
Page view(s) 20
519
Last Week
0
0
Last month
9
9
checked on Aug 29, 2024
Google ScholarTM
Check
Altmetric
Items in KTISIS are protected by copyright, with all rights reserved, unless otherwise indicated.