Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.14279/2740
DC FieldValueLanguage
dc.contributor.authorKasparis, Takis-
dc.contributor.authorAbu-Qahouq, Jaber A.-
dc.contributor.authorPongratananukul, Nattorn-
dc.contributor.otherΚασπαρής, Τάκης-
dc.date.accessioned2013-02-15T14:06:20Zen
dc.date.accessioned2013-05-17T05:29:35Z-
dc.date.accessioned2015-12-02T12:04:22Z-
dc.date.available2013-02-15T14:06:20Zen
dc.date.available2013-05-17T05:29:35Z-
dc.date.available2015-12-02T12:04:22Z-
dc.date.issued2002-03-
dc.identifier.citation17th Annual IEEE Applied Power Electronics Conference and Exposition, 2002, Dalas, Texasen_US
dc.identifier.isbn0-7803-7404-5-
dc.identifier.urihttps://hdl.handle.net/20.500.14279/2740-
dc.description.abstractFuture on-board low-voltage, high-current dc-dc voltage regulator module (VRM) requirements for a new generation of microprocessors are increasingly becoming stricter than ever as the demand for high dynamic performance and high power density converters with very small and limited output voltage deviation continues to increase. Future VRMs may have to be proactive instead of reactive so that it can respond before the upcoming large load transients. A new method to limit the VRM output voltage variation under large load transients is proposed. This method to be known as Transient Cancellation Control will be presented in this paper and how it reduces the output voltage overshoot/undershoot.en_US
dc.formatpdfen_US
dc.language.isoenen_US
dc.rights© 2002 IEEEen_US
dc.subjectMicroprocessorsen_US
dc.subjectElectromotive forceen_US
dc.subjectVoltage regulatorsen_US
dc.titleNovel transient cancellation control method for future generation of microprocessorsen_US
dc.typeConference Papersen_US
dc.affiliationUniversity of Central Floridaen
dc.collaborationUniversity of Central Floridaen_US
dc.subject.categoryElectrical Engineering - Electronic Engineering - Information Engineeringen_US
dc.countryUnited Statesen_US
dc.subject.fieldEngineering and Technologyen_US
dc.publicationPeer Revieweden_US
dc.relation.conferenceIEEE Applied Power Electronics Conference and Exposition - APECen_US
dc.identifier.doi10.1109/APEC.2002.989250en_US
dc.dept.handle123456789/54en
cut.common.academicyear2001-2002en_US
item.openairecristypehttp://purl.org/coar/resource_type/c_c94f-
item.grantfulltextnone-
item.cerifentitytypePublications-
item.fulltextNo Fulltext-
item.languageiso639-1en-
item.openairetypeconferenceObject-
crisitem.author.deptDepartment of Electrical Engineering, Computer Engineering and Informatics-
crisitem.author.facultyFaculty of Engineering and Technology-
crisitem.author.orcid0000-0003-3486-538x-
crisitem.author.parentorgFaculty of Engineering and Technology-
Appears in Collections:Δημοσιεύσεις σε συνέδρια /Conference papers or poster or presentation
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