Please use this identifier to cite or link to this item:
https://hdl.handle.net/20.500.14279/2740
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kasparis, Takis | - |
dc.contributor.author | Abu-Qahouq, Jaber A. | - |
dc.contributor.author | Pongratananukul, Nattorn | - |
dc.contributor.other | Κασπαρής, Τάκης | - |
dc.date.accessioned | 2013-02-15T14:06:20Z | en |
dc.date.accessioned | 2013-05-17T05:29:35Z | - |
dc.date.accessioned | 2015-12-02T12:04:22Z | - |
dc.date.available | 2013-02-15T14:06:20Z | en |
dc.date.available | 2013-05-17T05:29:35Z | - |
dc.date.available | 2015-12-02T12:04:22Z | - |
dc.date.issued | 2002-03 | - |
dc.identifier.citation | 17th Annual IEEE Applied Power Electronics Conference and Exposition, 2002, Dalas, Texas | en_US |
dc.identifier.isbn | 0-7803-7404-5 | - |
dc.identifier.uri | https://hdl.handle.net/20.500.14279/2740 | - |
dc.description.abstract | Future on-board low-voltage, high-current dc-dc voltage regulator module (VRM) requirements for a new generation of microprocessors are increasingly becoming stricter than ever as the demand for high dynamic performance and high power density converters with very small and limited output voltage deviation continues to increase. Future VRMs may have to be proactive instead of reactive so that it can respond before the upcoming large load transients. A new method to limit the VRM output voltage variation under large load transients is proposed. This method to be known as Transient Cancellation Control will be presented in this paper and how it reduces the output voltage overshoot/undershoot. | en_US |
dc.format | en_US | |
dc.language.iso | en | en_US |
dc.rights | © 2002 IEEE | en_US |
dc.subject | Microprocessors | en_US |
dc.subject | Electromotive force | en_US |
dc.subject | Voltage regulators | en_US |
dc.title | Novel transient cancellation control method for future generation of microprocessors | en_US |
dc.type | Conference Papers | en_US |
dc.affiliation | University of Central Florida | en |
dc.collaboration | University of Central Florida | en_US |
dc.subject.category | Electrical Engineering - Electronic Engineering - Information Engineering | en_US |
dc.country | United States | en_US |
dc.subject.field | Engineering and Technology | en_US |
dc.publication | Peer Reviewed | en_US |
dc.relation.conference | IEEE Applied Power Electronics Conference and Exposition - APEC | en_US |
dc.identifier.doi | 10.1109/APEC.2002.989250 | en_US |
dc.dept.handle | 123456789/54 | en |
cut.common.academicyear | 2001-2002 | en_US |
item.openairetype | conferenceObject | - |
item.cerifentitytype | Publications | - |
item.fulltext | No Fulltext | - |
item.grantfulltext | none | - |
item.openairecristype | http://purl.org/coar/resource_type/c_c94f | - |
item.languageiso639-1 | en | - |
crisitem.author.dept | Department of Electrical Engineering, Computer Engineering and Informatics | - |
crisitem.author.faculty | Faculty of Engineering and Technology | - |
crisitem.author.orcid | 0000-0003-3486-538x | - |
crisitem.author.parentorg | Faculty of Engineering and Technology | - |
Appears in Collections: | Δημοσιεύσεις σε συνέδρια /Conference papers or poster or presentation |
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