Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.14279/24244
DC FieldValueLanguage
dc.contributor.authorTheodosiou, Antreas-
dc.contributor.authorLeal-Junior, Arnaldo-
dc.contributor.authorMarques, Carlos-
dc.contributor.authorFrizera, Anselmo-
dc.contributor.authorFernandes, Antonio J.S.-
dc.contributor.authorStancalie, Andrei-
dc.contributor.authorIoannou, Andreas-
dc.contributor.authorIghigeanu, Daniel-
dc.contributor.authorMihalcea, Razvan-
dc.contributor.authorNegut, Daniel Constantin-
dc.contributor.authorKalli, Kyriacos-
dc.date.accessioned2022-02-16T16:17:01Z-
dc.date.available2022-02-16T16:17:01Z-
dc.date.issued2021-12-01-
dc.identifier.citationSensors, 2021, vol. 21, no. 24, articl. no. 8379en_US
dc.identifier.issn14248220-
dc.identifier.urihttps://hdl.handle.net/20.500.14279/24244-
dc.description.abstractThis work presents an extensive, comparative study of the gamma and electron radiation effects on the behaviour of femtosecond laser-inscribed fibre Bragg gratings (FBGs) using the point-by-point and plane-by-plane inscription methods. The FBGs were inscribed in standard telecommunication single mode silica fibre (SMF28) and exposed to a total accumulated radiation dose of 15 kGy for both gamma and electron radiation. The gratings’ spectra were measured and analysed before and after the exposure to radiation, with complementary material characterisation using Fourier transform infrared (FTIR) spectroscopy. Changes in the response of the FBGs’ temperature coefficients were analysed on exposure to the different types of radiation, and we consider which of the two inscription methods result in gratings that are more robust in such harsh environments. Moreover, we used the FTIR spectroscopy to locate which chemical bonds are responsible for the changes on temperature coefficients and which are related with the optical characteristics of the FBGs.en_US
dc.formatpdfen_US
dc.language.isoenen_US
dc.relation.ispartofSensorsen_US
dc.rights© The Author(s).en_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/*
dc.subjectElectron radiationen_US
dc.subjectFBGsen_US
dc.subjectFemtosecond laser inscriptionen_US
dc.subjectGamma radiationen_US
dc.subjectOptical sensorsen_US
dc.subjectRadiation hardnessen_US
dc.titleComparative study of γ-and e-radiation-induced effects on fbgs using different femtosecond laser inscription methodsen_US
dc.typeArticleen_US
dc.collaborationCyprus University of Technologyen_US
dc.collaborationFederal University of Espirito Santoen_US
dc.collaborationCenter for Advanced Laser Technologies - CETALen_US
dc.collaborationHoria Hulubei National Institute of Physics and Nuclear Engineeringen_US
dc.subject.categoryMaterials Engineeringen_US
dc.journalsOpen Accessen_US
dc.countryCyprusen_US
dc.countryBrazilen_US
dc.countryPortugalen_US
dc.countryRomaniaen_US
dc.subject.fieldEngineering and Technologyen_US
dc.publicationPeer Revieweden_US
dc.identifier.doi10.3390/s21248379en_US
dc.identifier.pmid34960466-
dc.identifier.scopus2-s2.0-85121106536-
dc.identifier.urlhttps://api.elsevier.com/content/abstract/scopus_id/85121106536-
dc.relation.issue24en_US
dc.relation.volume21en_US
cut.common.academicyear2020-2021en_US
item.openairetypearticle-
item.cerifentitytypePublications-
item.fulltextWith Fulltext-
item.grantfulltextopen-
item.openairecristypehttp://purl.org/coar/resource_type/c_6501-
item.languageiso639-1en-
crisitem.author.deptDepartment of Electrical Engineering, Computer Engineering and Informatics-
crisitem.author.deptDepartment of Electrical Engineering, Computer Engineering and Informatics-
crisitem.author.deptDepartment of Electrical Engineering, Computer Engineering and Informatics-
crisitem.author.facultyFaculty of Engineering and Technology-
crisitem.author.facultyFaculty of Engineering and Technology-
crisitem.author.facultyFaculty of Engineering and Technology-
crisitem.author.orcid0000-0002-5912-9138-
crisitem.author.orcid0000-0002-0824-8188-
crisitem.author.orcid0000-0003-4541-092X-
crisitem.author.parentorgFaculty of Engineering and Technology-
crisitem.author.parentorgFaculty of Engineering and Technology-
crisitem.author.parentorgFaculty of Engineering and Technology-
crisitem.journal.journalissn1424-8220-
crisitem.journal.publisherMDPI-
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