Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.14279/2381
DC FieldValueLanguage
dc.contributor.authorKasparis, Takis-
dc.contributor.authorCampos, Jesse-
dc.contributor.otherΚασπαρής, Τάκης-
dc.date.accessioned2013-02-19T10:41:48Zen
dc.date.accessioned2013-05-17T05:29:43Z-
dc.date.accessioned2015-12-02T11:21:43Z-
dc.date.available2013-02-19T10:41:48Zen
dc.date.available2013-05-17T05:29:43Z-
dc.date.available2015-12-02T11:21:43Z-
dc.date.issued1994-04-13-
dc.identifier.citationProceedings of the IEEE SOUTHEASTCON, 1994, Miami, United Statesen_US
dc.identifier.issn0734-7502-
dc.description.abstractTexture is an important characteristic in an image and it is used to identify objects or regions of interest within an image. The problem of texture classification has been widely studied and most of the proposed techniques fall into two categories; statistical or structural. In this paper a structural approach based on the Hough method for line detection is proposed, for the description of periodic textures that consist of mostly straight lines. The features used for classification procedure are based on the relative orientations and separations of lines. With the proper normalizations, classification is independent of geometrical transformations such as rotation, translation, and/or scaling. This approach provides more unique features compared to other approaches. Experimental results with test patterns are presented.en_US
dc.formatpdfen_US
dc.language.isoenen_US
dc.rights© 1994 IEEEen_US
dc.subjectAlgorithmsen_US
dc.subjectClassificationen_US
dc.subjectImage processingen_US
dc.subjectAlgebras, Linearen_US
dc.titleClassification of periodic patterns using hough transformen_US
dc.typeConference Papersen_US
dc.affiliationUniversity of Central Floridaen
dc.collaborationUniversity of Central Floridaen_US
dc.subject.categoryElectrical Engineering - Electronic Engineering - Information Engineeringen_US
dc.countryUnited Statesen_US
dc.subject.fieldEngineering and Technologyen_US
dc.publicationPeer Revieweden_US
dc.relation.conferenceIEEE SOUTHEASTCONen_US
dc.identifier.doi10.1109/SECON.1994.324337en_US
dc.dept.handle123456789/54en
cut.common.academicyear1995-1996en_US
item.grantfulltextnone-
item.openairecristypehttp://purl.org/coar/resource_type/c_c94f-
item.fulltextNo Fulltext-
item.languageiso639-1en-
item.cerifentitytypePublications-
item.openairetypeconferenceObject-
crisitem.author.deptDepartment of Electrical Engineering, Computer Engineering and Informatics-
crisitem.author.facultyFaculty of Engineering and Technology-
crisitem.author.orcid0000-0003-3486-538x-
crisitem.author.parentorgFaculty of Engineering and Technology-
Appears in Collections:Δημοσιεύσεις σε συνέδρια /Conference papers or poster or presentation
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