Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.14279/18302
DC FieldValueLanguage
dc.contributor.authorAbramavičius, Vytautas-
dc.contributor.authorAmarasinghe, Dimali C.V.-
dc.contributor.authorDevižis, Andrius-
dc.contributor.authorInfahsaeng, Yingyot-
dc.contributor.authorBruno, Annalisa-
dc.contributor.authorFoster, Samuel-
dc.contributor.authorKeivanidis, Panagiotis E.-
dc.contributor.authorAbramavičius, Darius-
dc.contributor.authorNelson, Jenny-
dc.contributor.authorYartsev, Arkady-
dc.contributor.authorSundstrom, Villy-
dc.contributor.authorGulbinas, Vidmantas-
dc.date.accessioned2020-04-29T19:31:19Z-
dc.date.available2020-04-29T19:31:19Z-
dc.date.issued2014-02-14-
dc.identifier.citationPhysical Chemistry Chemical Physics, 2014, vol. 16, no. 6, pp. 2686-2692en_US
dc.identifier.issn14639084-
dc.identifier.urihttps://hdl.handle.net/20.500.14279/18302-
dc.description.abstractCharge transport dynamics in solar cell devices based on as-spun and annealed P3HT:PCBM films are compared using ultrafast time-resolved optical probing of the electric field by means of field-induced second harmonic generation. The results show that charge carriers drift about twice as far during the first 3 ns after photogeneration in a device where the active layer has been thermally annealed. The carrier dynamics were modelled using Monte-Carlo simulations and good agreement between experimental and simulated drift dynamics was obtained using identical model parameters for both cells, but with different average PCBM and polymer domain sizes. The calculations suggest that small domain sizes in as-spun samples limit the carrier separation distance disabling their escape from geminate recombination.en_US
dc.formatpdfen_US
dc.language.isoenen_US
dc.relation.ispartofPhysical Chemistry Chemical Physicsen_US
dc.rights© Royal Society of Chemistryen_US
dc.titleCarrier motion in as-spun and annealed P3HT:PCBM blends revealed by ultrafast optical electric field probing and Monte Carlo simulationsen_US
dc.typeArticleen_US
dc.collaborationCenter for Physical Sciences and Technologyen_US
dc.collaborationVilnius Universityen_US
dc.collaborationLund Universityen_US
dc.subject.categoryElectrical Engineering - Electronic Engineering - Information Engineeringen_US
dc.journalsSubscriptionen_US
dc.countryLithuaniaen_US
dc.countrySwedenen_US
dc.subject.fieldEngineering and Technologyen_US
dc.publicationPeer Revieweden_US
dc.identifier.doi10.1039/c3cp54605een_US
dc.identifier.pmid24384829-
dc.identifier.scopus2-s2.0-84892621540-
dc.identifier.urlhttps://api.elsevier.com/content/abstract/scopus_id/84892621540-
dc.relation.issue6en_US
dc.relation.volume16en_US
cut.common.academicyear2013-2014en_US
dc.identifier.spage2686en_US
dc.identifier.epage2692en_US
item.fulltextNo Fulltext-
item.cerifentitytypePublications-
item.grantfulltextnone-
item.openairecristypehttp://purl.org/coar/resource_type/c_6501-
item.openairetypearticle-
item.languageiso639-1en-
crisitem.journal.journalissn1463-9084-
crisitem.journal.publisherRoyal Society of Chemistry-
crisitem.author.deptDepartment of Mechanical Engineering and Materials Science and Engineering-
crisitem.author.facultyFaculty of Engineering and Technology-
crisitem.author.orcid0000-0002-5336-249X-
crisitem.author.parentorgFaculty of Engineering and Technology-
Appears in Collections:Άρθρα/Articles
CORE Recommender
Show simple item record

SCOPUSTM   
Citations

25
checked on Feb 1, 2024

WEB OF SCIENCETM
Citations

24
Last Week
0
Last month
0
checked on Oct 29, 2023

Page view(s) 50

289
Last Week
1
Last month
13
checked on May 13, 2024

Google ScholarTM

Check

Altmetric


Items in KTISIS are protected by copyright, with all rights reserved, unless otherwise indicated.