Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.14279/18257
DC FieldValueLanguage
dc.contributor.authorKirkpatrick, James-
dc.contributor.authorKeivanidis, Panagiotis E.-
dc.contributor.authorBruno, Annalisa-
dc.contributor.authorMa, Fei-
dc.contributor.authorHaque, Saif A-
dc.contributor.authorYarstev, Arkady-
dc.contributor.authorSundstrom, Villy-
dc.contributor.authorNelson, Jenny-
dc.date.accessioned2020-04-10T18:29:15Z-
dc.date.available2020-04-10T18:29:15Z-
dc.date.issued2011-12-29-
dc.identifier.citationJournal of Physical Chemistry B, 2011, vol. 115, no. 51, pp. 15174-15180en_US
dc.identifier.issn15205207-
dc.description.abstractCharge generation and recombination are studied in blend films of poly-3-hexylthiophene (P3HT) and [6,6']phenyl C61 butyric acid methyl ester (PCBM) using ultrafast transient absorption spectroscopy. We find that the charge generation yield depends upon both blend film composition and thermal annealing. The data suggest that recombination occurs over a wide range of time scales and that, in the least favorable cases, the fastest charge recombination occurs on a time scale similar to exciton diffusion. The results are explained using a simple model that incorporates the effect of P3HT domain size on exciton diffusion and uses empirical models of recombination kinetics. We propose our method as a route to interpretation of spectroscopic data where different processes occur on similar time scales.en_US
dc.formatpdfen_US
dc.language.isoenen_US
dc.relation.ispartofJournal of Physical Chemistry Ben_US
dc.rights© American Chemical Societyen_US
dc.subjectExcitonsen_US
dc.subjectDiffusionen_US
dc.subjectOrganic polymersen_US
dc.subjectKineticsen_US
dc.subjectRecombinationen_US
dc.titleUltrafast transient optical studies of charge pair generation and recombination in poly-3-hexylthiophene(P3ht):[6,6]phenyl C61 butyric methyl acid ester (PCBM) blend filmsen_US
dc.typeArticleen_US
dc.collaborationImperial College Londonen_US
dc.collaborationLund Universityen_US
dc.subject.categoryElectrical Engineering - Electronic Engineering - Information Engineeringen_US
dc.journalsSubscriptionen_US
dc.countryUnited Kingdomen_US
dc.countrySwedenen_US
dc.subject.fieldEngineering and Technologyen_US
dc.publicationPeer Revieweden_US
dc.identifier.doi10.1021/jp205731fen_US
dc.identifier.pmid22082090-
dc.identifier.scopus2-s2.0-84255204942-
dc.identifier.urlhttps://api.elsevier.com/content/abstract/scopus_id/84255204942-
dc.relation.issue51en_US
dc.relation.volume115en_US
cut.common.academicyear2010-2011en_US
dc.identifier.spage15174en_US
dc.identifier.epage15180en_US
item.openairetypearticle-
item.cerifentitytypePublications-
item.fulltextNo Fulltext-
item.grantfulltextnone-
item.openairecristypehttp://purl.org/coar/resource_type/c_6501-
item.languageiso639-1en-
crisitem.author.deptDepartment of Mechanical Engineering and Materials Science and Engineering-
crisitem.author.facultyFaculty of Engineering and Technology-
crisitem.author.orcid0000-0002-5336-249X-
crisitem.author.parentorgFaculty of Engineering and Technology-
crisitem.journal.journalissn1520-5207-
crisitem.journal.publisherAmerican Chemical Society-
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