Please use this identifier to cite or link to this item:
https://hdl.handle.net/20.500.14279/18183
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Friedel, Bettina | - |
dc.contributor.author | Keivanidis, Panagiotis E. | - |
dc.contributor.author | Brenner, Thomas J.K. | - |
dc.contributor.author | Abrusci, Agnese | - |
dc.contributor.author | McNeill, Christopher R. | - |
dc.contributor.author | Friend, Richard H. | - |
dc.contributor.author | Greenham, Neil C. | - |
dc.date.accessioned | 2020-03-27T18:11:23Z | - |
dc.date.available | 2020-03-27T18:11:23Z | - |
dc.date.issued | 2009-09-08 | - |
dc.identifier.citation | Macromolecules, 2009, vol. 42, no. 17, pp. 6741-6747 | en_US |
dc.identifier.issn | 15205835 | - |
dc.identifier.uri | https://hdl.handle.net/20.500.14279/18183 | - |
dc.description.abstract | We have investigated the effects of thickness variation and thermal treatment of the electrode polymer poly(3,4-ethylenedioxythiophene): poly(styrenesulfonic acid) (PEDOT:PSS) in photovoltaic and photodetector devices using conjugated polymer blends as the photoactive material. By variation of the PEDOT:PSS layer thickness between 25 and 150 nm, we found optimum device performance, in particular low dark current and high external quantum efficiency (EQE) and open-circuit voltage (Voc), at around 70 nm. This has been observed for two different active layers. Annealing studies on the PEDOT:PSS films, with temperatures varied between 120 and 400°C, showed an optimum device performance, in particular EQE and Voc at 250°C. This optimum performance was found to be associated with loss of water from the PSS shell of the PEDOT:PSS grains. For annealing temperatures above 260°C, device performance was dramatically reduced. This was associated with chemical decomposition leading to loss of sulfonic acid, although this did not significantly affect the in-plane conductivity. © 2009 American Chemical Society. | en_US |
dc.format | en_US | |
dc.language.iso | en | en_US |
dc.relation.ispartof | Macromolecules | en_US |
dc.rights | © American Chemical Society | en_US |
dc.subject | Thickness | en_US |
dc.subject | External quantum efficiency | en_US |
dc.subject | Layers | en_US |
dc.subject | Conjugated polymersAnnealing (metallurgy) | en_US |
dc.title | Effects of layer thickness and annealing of PEDOT:PSS layers in organic photodetectors | en_US |
dc.type | Article | en_US |
dc.collaboration | University of Cambridge | en_US |
dc.subject.category | Mechanical Engineering | en_US |
dc.journals | Subscription | en_US |
dc.country | United Kingdom | en_US |
dc.subject.field | Engineering and Technology | en_US |
dc.publication | Peer Reviewed | en_US |
dc.identifier.doi | 10.1021/ma901182u | en_US |
dc.identifier.scopus | 2-s2.0-69549086303 | - |
dc.identifier.url | https://api.elsevier.com/content/abstract/scopus_id/69549086303 | - |
dc.relation.issue | 17 | en_US |
dc.relation.volume | 42 | en_US |
cut.common.academicyear | 2009-2010 | en_US |
dc.identifier.spage | 6741 | en_US |
dc.identifier.epage | 6747 | en_US |
item.fulltext | No Fulltext | - |
item.languageiso639-1 | en | - |
item.grantfulltext | none | - |
item.openairecristype | http://purl.org/coar/resource_type/c_6501 | - |
item.cerifentitytype | Publications | - |
item.openairetype | article | - |
crisitem.journal.journalissn | 1520-5835 | - |
crisitem.journal.publisher | American Chemical Society | - |
crisitem.author.dept | Department of Mechanical Engineering and Materials Science and Engineering | - |
crisitem.author.faculty | Faculty of Engineering and Technology | - |
crisitem.author.orcid | 0000-0002-5336-249X | - |
crisitem.author.parentorg | Faculty of Engineering and Technology | - |
Appears in Collections: | Άρθρα/Articles |
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