Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.14279/1768
DC FieldValueLanguage
dc.contributor.authorEichmann, George-
dc.contributor.authorKasparis, Takis-
dc.contributor.otherΚασπαρής, Τάκης-
dc.date.accessioned2013-02-19T15:46:40Zen
dc.date.accessioned2013-05-17T05:22:05Z-
dc.date.accessioned2015-12-02T09:55:08Z-
dc.date.available2013-02-19T15:46:40Zen
dc.date.available2013-05-17T05:22:05Z-
dc.date.available2015-12-02T09:55:08Z-
dc.date.issued1988-03-
dc.identifier.citationComputer Vision, Graphics and Image Processing, 1988, Volume 41, Issue 3, Pages 267-281en_US
dc.identifier.issn0734189X-
dc.identifier.urihttps://hdl.handle.net/20.500.14279/1768-
dc.description.abstractTexture is one of the important image characteristics and is used to identify objects or regions of interest. The problem of texture classification has been widely studied. Texture classification techniques are either statistical or structural. Some statistical texture classification approaches use Fourier power-spectrum features, while others are based on first- and second-order statistics of gray level differences. Periodic textures that consist of mostly straight lines are of particular interest. In this paper, a new structural approach based on the Hough method of line detection is introduced. This classification is based on the relative orientation and location of the lines within the texture. With proper normalization, the classification is independent of geometrical transformations such as rotation, translation, and/or scaling. Experimental results will also be presented.en_US
dc.formatpdfen_US
dc.language.isoenen_US
dc.relation.ispartofComputer Vision, Graphics and Image Processingen_US
dc.rights© 1988 by Academic Pressen_US
dc.subjectImage processingen_US
dc.subjectImage analysisen_US
dc.subjectAlgorithmsen_US
dc.subjectTopologyen_US
dc.titleTopologically invariant texture descriptorsen_US
dc.typeArticleen_US
dc.collaborationCity University of New Yorken_US
dc.subject.categoryElectrical Engineering - Electronic Engineering - Information Engineeringen_US
dc.journalsSubscription Journalen_US
dc.countryUnited Statesen_US
dc.subject.fieldEngineering and Technologyen_US
dc.publicationPeer Revieweden_US
dc.identifier.doi10.1016/0734-189X(88)90102-8en_US
dc.dept.handle123456789/54en
cut.common.academicyear2019-2020en_US
item.grantfulltextnone-
item.openairecristypehttp://purl.org/coar/resource_type/c_6501-
item.fulltextNo Fulltext-
item.languageiso639-1en-
item.cerifentitytypePublications-
item.openairetypearticle-
crisitem.journal.journalissn0734-189X-
crisitem.journal.publisherElsevier-
crisitem.author.deptDepartment of Electrical Engineering, Computer Engineering and Informatics-
crisitem.author.facultyFaculty of Engineering and Technology-
crisitem.author.orcid0000-0003-3486-538x-
crisitem.author.parentorgFaculty of Engineering and Technology-
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