Please use this identifier to cite or link to this item:
https://hdl.handle.net/20.500.14279/1689
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Patsalas, Panos | - |
dc.contributor.author | Kelires, Pantelis C. | - |
dc.contributor.author | Mathioudakis, Christos | - |
dc.date.accessioned | 2013-03-04T11:24:51Z | en |
dc.date.accessioned | 2013-05-17T05:22:16Z | - |
dc.date.accessioned | 2015-12-02T09:56:46Z | - |
dc.date.available | 2013-03-04T11:24:51Z | en |
dc.date.available | 2013-05-17T05:22:16Z | - |
dc.date.available | 2015-12-02T09:56:46Z | - |
dc.date.issued | 2002-05-13 | - |
dc.identifier.citation | Physical Review B - Condensed Matter and Materials Physics, 2002, vol. 65, no. 20, pp. 2052031-20520314 | en_US |
dc.identifier.issn | 10980121 | - |
dc.identifier.uri | https://hdl.handle.net/20.500.14279/1689 | - |
dc.description.abstract | A possible route toward reducing the intrinsic compressive stress in as-grown amorphous carbon films on Si substrates, with a high fraction of tetrahedral bonding, is by forming multilayered a-C structures composed of layers dense and rich in sp3 sites alternated by layers rich in sp2 geometries, a type of an amorphous superlattice. We present here a combined theoretical and experimental effort to investigate the stability, stress, and elastic properties of this type of a-C material. Our theoretical approach is based on Monte Carlo simulations within an empirical potential scheme, while the experimental part consists of spectroscopic ellipsometry, x-ray reflectivity, stress, and nanoindentation measurements in films prepared by magnetron sputtering. Our central result is that the average stress in the multilayered structures is nearly eliminated through layer-by-layer stress compensation, yet the fraction of sp3 sites in the dense regions remains high, sustained by the overwhelmingly compressive local stresses. The sp3-rich layers are stable both against a moderate increase of the width of the low-density layers, as well as under thermal annealing. The elastic moduli of the multilayered films are comparable with those of single-layer films. This, in conjuction with their low stress, makes them suitable for mechanical purposes. | en_US |
dc.format | en_US | |
dc.language.iso | en | en_US |
dc.relation.ispartof | Physical Review B | en_US |
dc.rights | © The American Physical Society. | en_US |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/3.0/us/ | * |
dc.subject | Carbon | en_US |
dc.subject | Silicon | en_US |
dc.subject | Chemical structure | en_US |
dc.subject | Elasticity | en_US |
dc.subject | Monte Carlo method | en_US |
dc.subject | Thermal analysis | en_US |
dc.title | Nanomechanical properties of multilayered amorphous carbon structures | en_US |
dc.type | Article | en_US |
dc.affiliation | University of Crete | en |
dc.collaboration | University of Crete | en_US |
dc.collaboration | University of Ioannina | en_US |
dc.collaboration | University of West Attica | en_US |
dc.subject.category | ENGINEERING AND TECHNOLOGY | en_US |
dc.journals | Subscription | en_US |
dc.country | Greece | en_US |
dc.subject.field | Engineering and Technology | en_US |
dc.publication | Peer Reviewed | en_US |
dc.identifier.doi | 10.1103/PhysRevB.65.205203 | en_US |
dc.dept.handle | 123456789/54 | en |
dc.relation.issue | 20 | en_US |
dc.relation.volume | 65 | en_US |
cut.common.academicyear | 2002-2003 | en_US |
dc.identifier.spage | 2052031 | en_US |
dc.identifier.epage | 20520314 | en_US |
item.openairetype | article | - |
item.cerifentitytype | Publications | - |
item.fulltext | No Fulltext | - |
item.grantfulltext | none | - |
item.openairecristype | http://purl.org/coar/resource_type/c_6501 | - |
item.languageiso639-1 | en | - |
crisitem.author.dept | Department of Mechanical Engineering and Materials Science and Engineering | - |
crisitem.author.dept | Department of Mechanical Engineering and Materials Science and Engineering | - |
crisitem.author.faculty | Faculty of Engineering and Technology | - |
crisitem.author.faculty | Faculty of Engineering and Technology | - |
crisitem.author.orcid | 0000-0002-0268-259X | - |
crisitem.author.parentorg | Faculty of Engineering and Technology | - |
crisitem.author.parentorg | Faculty of Engineering and Technology | - |
crisitem.journal.journalissn | 2469-9969 | - |
crisitem.journal.publisher | American Physical Society | - |
Appears in Collections: | Άρθρα/Articles |
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