Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.14279/1682
DC FieldValueLanguage
dc.contributor.authorCharalampidis, Dimitrios-
dc.contributor.authorKasparis, Takis-
dc.contributor.otherΚασπαρής, Τάκης-
dc.date.accessioned2013-02-15T10:41:28Zen
dc.date.accessioned2013-05-17T05:22:10Z-
dc.date.accessioned2015-12-02T09:56:24Z-
dc.date.available2013-02-15T10:41:28Zen
dc.date.available2013-05-17T05:22:10Z-
dc.date.available2015-12-02T09:56:24Z-
dc.date.issued2002-08-
dc.identifier.citationIEEE Transactions on Image Processing, 2002, vol. 11, no. 8, pp. 825-837en_US
dc.identifier.issn10577149-
dc.identifier.urihttps://hdl.handle.net/20.500.14279/1682-
dc.description.abstractIn this paper, we introduce a rotational invariant feature set for texture segmentation and classification, based on an extension of fractal dimension (FD) features. The FD extracts roughness information from images considering all available scales at once. In this work, a single scale is considered at a time so that textures with scale-dependent properties are satisfactorily characterized. Single-scale features are combined with multiple-scale features for a more complete textural representation. Wavelets are employed for the computation of single- and multiple-scale roughness features because of their ability to extract information at different resolutions. Features are extracted in multiple directions using directional wavelets, and the feature vector is finally transformed to a rotational invariant feature vector that retains the texture directional information. An iterative K-means scheme is used for segmentation, and a simplified form of a Bayesian classifier is used for classification. The use of the roughness feature set results in high-quality segmentation performance. Furthermore, it is shown that the roughness feature set exhibits a higher classification rate than other feature vectors presented in this work. The feature set retains the important properties of FD-based features, namely insensitivity to absolute illumination and contrast.en_US
dc.formatpdfen_US
dc.language.isoenen_US
dc.relation.ispartofIEEE Transactions on Image Processingen_US
dc.rights© 2002 IEEEen_US
dc.subjectFractalsen_US
dc.subjectTexture (Art)en_US
dc.subjectRemote sensingen_US
dc.subjectLightingen_US
dc.subjectClassificationen_US
dc.titleWavelet-based rotational invariant roughness features for texture classification and segmentationen_US
dc.typeArticleen_US
dc.collaborationNew Orleans Universityen_US
dc.subject.categoryElectrical Engineering - Electronic Engineering - Information Engineeringen_US
dc.journalsSubscription Journalen_US
dc.countryUnited Statesen_US
dc.subject.fieldEngineering and Technologyen_US
dc.publicationPeer Revieweden_US
dc.identifier.doi10.1109/TIP.2002.801117en_US
dc.dept.handle123456789/54en
cut.common.academicyear2001-2002en_US
item.grantfulltextnone-
item.openairecristypehttp://purl.org/coar/resource_type/c_6501-
item.fulltextNo Fulltext-
item.languageiso639-1en-
item.cerifentitytypePublications-
item.openairetypearticle-
crisitem.author.deptDepartment of Electrical Engineering, Computer Engineering and Informatics-
crisitem.author.facultyFaculty of Engineering and Technology-
crisitem.author.orcid0000-0003-3486-538x-
crisitem.author.parentorgFaculty of Engineering and Technology-
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