1. Ktisis Cyprus University of Technology
  2. Cyprus University of Technology (Research Output)
  3. Άρθρα/Articles
Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.14279/1667
DC FieldValueLanguage
dc.contributor.authorKalli, Kyriacos-
dc.contributor.authorOthonos, Andreas S.-
dc.contributor.authorChristofidès, Constantinos-
dc.contributor.otherΚαλλή, Κυριάκος-
dc.date.accessioned2013-02-22T14:34:14Zen
dc.date.accessioned2013-05-17T05:22:35Z-
dc.date.accessioned2015-12-02T09:55:55Z-
dc.date.available2013-02-22T14:34:14Zen
dc.date.available2013-05-17T05:22:35Z-
dc.date.available2015-12-02T09:55:55Z-
dc.date.issued1997-
dc.identifier.citationReview of Scientific Instruments,1997, vol. 68, no. 9, pp. 3544-3552en_US
dc.identifier.issn00346748-
dc.identifier.urihttps://hdl.handle.net/20.500.14279/1667-
dc.description.abstractA study of a thermal wave hydrogen sensor interrogated via transverse optical beam deflection spectroscopy is presented. The sensor is a thin film polyvinylidene fluoride film coated with a thin palladium layer. The sensitivity to hydrogen results from thermal boundary condition changes at the gas-film interface and depends upon the thermophysical properties of the gas. A simple one-dimensional model is developed to qualitatively and semi-quantitatively describe the experimental results and it shows good agreement with the experiment. Concentrations of 0.1% hydrogen in the presence of a balanced air mixture and at room temperature were measured for this sensor and they indicate possible sensitivities approaching 100 ppm.en_US
dc.formatpdfen_US
dc.language.isoenen_US
dc.relation.ispartofReview of Scientific Instrumentsen_US
dc.rights© American Institute of Physics.en_US
dc.subjectSpectroscopyen_US
dc.subjectHydrogenen_US
dc.subjectThin filmsen_US
dc.subjectGasen_US
dc.titleHydrogen gas detection via photothermal deflection measurementen_US
dc.typeArticleen_US
dc.collaborationUniversity of Cyprusen_US
dc.subject.categoryElectrical Engineering - Electronic Engineering - Information Engineeringen_US
dc.journalsSubscriptionen_US
dc.countryCyprusen_US
dc.subject.fieldEngineering and Technologyen_US
dc.publicationPeer Revieweden_US
dc.identifier.doi10.1063/1.1148320en_US
dc.dept.handle123456789/54en
dc.relation.issue9en_US
dc.relation.volume68en_US
cut.common.academicyear1997-1998en_US
dc.identifier.spage3544en_US
dc.identifier.epage3552en_US
item.fulltextNo Fulltext-
item.cerifentitytypePublications-
item.grantfulltextnone-
item.openairecristypehttp://purl.org/coar/resource_type/c_6501-
item.openairetypearticle-
item.languageiso639-1en-
crisitem.journal.journalissn1089-7623-
crisitem.journal.publisherAmerican Institute of Physics-
crisitem.author.deptDepartment of Electrical Engineering, Computer Engineering and Informatics-
crisitem.author.facultyFaculty of Engineering and Technology-
crisitem.author.orcid0000-0003-4541-092X-
crisitem.author.parentorgFaculty of Engineering and Technology-
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