Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.14279/1545
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dc.contributor.authorHadjisavvas, George C.-
dc.contributor.authorKopidakis, Georgios-
dc.contributor.authorKelires, Pantelis C.-
dc.contributor.otherΚελίρης, Παντελής-
dc.date.accessioned2013-03-04T09:12:46Zen
dc.date.accessioned2013-05-17T05:22:49Z-
dc.date.accessioned2015-12-02T10:11:32Z-
dc.date.available2013-03-04T09:12:46Zen
dc.date.available2013-05-17T05:22:49Z-
dc.date.available2015-12-02T10:11:32Z-
dc.date.issued2001-09-10-
dc.identifier.citationPhysical Review B, 2001,vol. 64, no. 12, pp. 1254131-12541312en_US
dc.identifier.issn10980121-
dc.identifier.urihttps://hdl.handle.net/20.500.14279/1545-
dc.description.abstractUsing Monte Carlo simulations within the empirical potential approach, we predict and analyze possible models of the surface structure of amorphous silicon. This is a fundamental problem about which knowledge is incomplete. We address the central question regarding the dominant type of nontetrahedral atoms at the surface. Our investigations lead to two markedly different models of the surface structure. One of the models exhibits a surface layer terminated by threefold- and fourfold-coordinated atoms. In general, threefold atoms are on top and form mostly dimers and chainlike structures. The other model requires that the surface is terminated by fourfold atoms and by fivefold atoms assembled in clusters of pyramidal shape, with both types of geometries heavily distorted. We also use the tight-binding method to calculate the electronic density of states of these two possible models. The electronic fingerprints of the nontetrahedral atoms within and near the energy gap region are quite different. This distinguishes clearly the two models and could guide experimental work to infer the microscopic picture of clean amorphous silicon surfaces.en_US
dc.formatpdfen_US
dc.language.isoenen_US
dc.relation.ispartofPhysical Review Ben_US
dc.rights© The American Physical Society.en_US
dc.rightsAttribution-NonCommercial-NoDerivs 3.0 United States*
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/3.0/us/*
dc.subjectGeometryen_US
dc.subjectSiliconen_US
dc.subjectMathematical analysisen_US
dc.subjectElectronen_US
dc.subjectSystem analysisen_US
dc.titleStructural models of amorphous silicon surfacesen_US
dc.typeArticleen_US
dc.affiliationUniversity of Creteen
dc.collaborationUniversity of Creteen_US
dc.subject.categoryMechanical Engineeringen_US
dc.journalsHybrid Open Accessen_US
dc.countryCyprusen_US
dc.subject.fieldEngineering and Technologyen_US
dc.publicationPeer Revieweden_US
dc.identifier.doi10.1103/PhysRevB.64.125413en_US
dc.dept.handle123456789/54en
dc.relation.issue12en_US
dc.relation.volume64en_US
cut.common.academicyear2001-2002en_US
dc.identifier.spage1254131en_US
dc.identifier.epage12541312en_US
item.fulltextNo Fulltext-
item.cerifentitytypePublications-
item.grantfulltextnone-
item.openairecristypehttp://purl.org/coar/resource_type/c_6501-
item.openairetypearticle-
item.languageiso639-1en-
crisitem.journal.journalissn2469-9969-
crisitem.journal.publisherAmerican Physical Society-
crisitem.author.deptDepartment of Mechanical Engineering and Materials Science and Engineering-
crisitem.author.facultyFaculty of Engineering and Technology-
crisitem.author.orcid0000-0002-0268-259X-
crisitem.author.parentorgFaculty of Engineering and Technology-
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