Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.14279/1478
Title: Electronic and optical properties of a-c from tight-binding molecular dynamics simulations
Authors: Kopidakis, Georgios 
Kelires, Pantelis C. 
Mathioudakis, Christos 
metadata.dc.contributor.other: Κελίρης, Παντελής
Μαθιουδάκης, Χρίστος
Major Field of Science: Engineering and Technology
Field Category: ENGINEERING AND TECHNOLOGY
Keywords: Computer simulation;Dielectric properties;Ellipsometry;Molecular dynamics;Molecular dynamics
Issue Date: 22-Jun-2005
Source: Thin Solid Films, 2005, vol. 482, no. 1-2, pp. 151-155
Volume: 482
Issue: 1-2
Start page: 151
End page: 155
Journal: Thin Solid Films 
Abstract: Although the structural and mechanical properties of a-C have been theoretically investigated in detail, this is not so for the optoelectronic properties. Many issues remain unclear, such as the influence of disorder and intrinsic defects on the localization of the electron states and on the optical transitions. Here, as a first step towards solving this kind of problems, we present a computational approach to the study of the optoelectronic properties of a-C. This is based on tight-binding (TB) molecular dynamics (TBMD) simulations using a reliable environment-dependent Hamiltonian. The a-C networks were generated by quenching from the liquid. The electronic density of states of all simulated networks show that the material is semiconducting, and that the gap is clearly controlled by the separation of the π and π* peaks. A Tauc gap analysis shows that the optical gap varies between 2.7 and 0.3 eV. We analyze the dielectric functions as a function of the sp3 fraction. We also compare the computational results with experimental dielectric function spectra revealing considerable consistency between theory and experiment.
URI: https://hdl.handle.net/20.500.14279/1478
ISSN: 00406090
DOI: 10.1016/j.tsf.2004.11.133
Rights: © Elsevier
Attribution-NonCommercial-NoDerivs 3.0 United States
Type: Article
Affiliation: University of Crete 
Affiliation : University of Crete 
Publication Type: Peer Reviewed
Appears in Collections:Άρθρα/Articles

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