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Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.14279/1449
DC FieldValueLanguage
dc.contributor.authorKalli, Kyriacos-
dc.contributor.authorChristofidès, Constantinos-
dc.contributor.authorOthonos, Andreas S.-
dc.contributor.otherΚαλλή, Κυριάκος-
dc.date.accessioned2013-02-21T13:53:58Zen
dc.date.accessioned2013-05-17T05:22:28Z-
dc.date.accessioned2015-12-02T10:05:18Z-
dc.date.available2013-02-21T13:53:58Zen
dc.date.available2013-05-17T05:22:28Z-
dc.date.available2015-12-02T10:05:18Z-
dc.date.issued1999-10-
dc.identifier.citationPlatinum Metals Review,1999, vol. 43, no. 4, pp. 155-157en_US
dc.identifier.issn14710676-
dc.identifier.urihttps://hdl.handle.net/20.500.14279/1449-
dc.description.abstractThe properties of thin palladium films on silicon dioxide/silicon substrates are investigated. As the electrical properties of very thin palladium films cannot be measured, due to highly discontinuous nature of the films resulting from the low level of surface coverage, simple laser diagnostic techniques are used. Results showed the changes in the absolute reflectivity of Pd-SiO2 films upon exposure to various concentrations of hydrogen gas as a function of temperature.en_US
dc.formatpdfen_US
dc.language.isoenen_US
dc.relation.ispartofPlatinum Metals Reviewen_US
dc.rights© Johnson Mattheyen_US
dc.subjectMetallic filmsen_US
dc.subjectHydrogenen_US
dc.subjectPalladiumen_US
dc.subjectSilicaen_US
dc.titleOptical response of thin supported palladium films to hydrogen: non-destructive testing for hydrogen detectionen_US
dc.typeArticleen_US
dc.collaborationUniversity of Cyprusen_US
dc.subject.categoryElectrical Engineering - Electronic Engineering - Information Engineeringen_US
dc.journalsHybrid Open Accessen_US
dc.countryCyprusen_US
dc.subject.fieldEngineering and Technologyen_US
dc.dept.handle123456789/54en
dc.relation.issue4en_US
dc.relation.volume43en_US
cut.common.academicyear1999-2000en_US
dc.identifier.spage155en_US
dc.identifier.epage157en_US
item.openairetypearticle-
item.cerifentitytypePublications-
item.fulltextWith Fulltext-
item.grantfulltextopen-
item.openairecristypehttp://purl.org/coar/resource_type/c_6501-
item.languageiso639-1en-
crisitem.author.deptDepartment of Electrical Engineering, Computer Engineering and Informatics-
crisitem.author.facultyFaculty of Engineering and Technology-
crisitem.author.orcid0000-0003-4541-092X-
crisitem.author.parentorgFaculty of Engineering and Technology-
crisitem.journal.journalissn1471-0676-
crisitem.journal.publisherJohnson Matthey-
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