Please use this identifier to cite or link to this item:
https://hdl.handle.net/20.500.14279/1416| Title: | Stability and interdiffusion at the a-c/si(100) interface | Authors: | Logothetidis, Stergios D. Gioti, Maria Kelires, Pantelis C. |
metadata.dc.contributor.other: | Κελίρης, Παντελής | Major Field of Science: | Engineering and Technology | Keywords: | Ellipsometry;Carbon;Computer simulation;Monte Carlo method | Issue Date: | May-1998 | Source: | Journal of Non-Crystalline Solids, 1998, vol. 227-230, no. part 2, pp. 1113-1117 | Volume: | 227-230 | Issue: | part 2 | Start page: | 1113 | End page: | 1117 | Journal: | Journal of Non-Crystalline Solids | Abstract: | Experimental ellipsometry measurements and theoretical Monte Carlo simulations reveal that interdiffusion takes place during the growth of amorphous carbon layers on Si(100) substrates. Intermixing is shown to be a strain mediated mechanism resulting in partial relief of local stresses both in the amorphous layer, as well as in the substrate layers near the interface. | URI: | https://hdl.handle.net/20.500.14279/1416 | ISSN: | 00223093 | DOI: | 10.1016/S0022-3093(98)00291-9 | Rights: | © Elsevier | Type: | Article | Affiliation: | University of Crete | Affiliation : | Aristotle University of Thessaloniki University of Crete Foundation for Research & Technology-Hellas (F.O.R.T.H.) |
| Appears in Collections: | Άρθρα/Articles |
CORE Recommender
SCOPUSTM
Citations
3
checked on Nov 9, 2023
WEB OF SCIENCETM
Citations
50
3
Last Week
0
0
Last month
0
0
checked on Oct 29, 2023
Page view(s) 50
440
Last Week
1
1
Last month
3
3
checked on Dec 22, 2024
Google ScholarTM
Check
Altmetric
Items in KTISIS are protected by copyright, with all rights reserved, unless otherwise indicated.