Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.14279/14136
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dc.contributor.authorChoulis, Stelios A.-
dc.contributor.authorOthonos, Andreas S.-
dc.contributor.authorNeophytou, Marios-
dc.contributor.authorItskos, Grigorios-
dc.date.accessioned2019-06-27T07:37:48Z-
dc.date.available2019-06-27T07:37:48Z-
dc.date.issued2012-04-09-
dc.identifier.citationApplied Physics Letter, 2012, vol.100, no.15en_US
dc.identifier.issn10773118-
dc.description.abstractWe report on excitation dynamics in pristine and bulk heterojunction films of the low bandgap silicon-bridged dithiophene copolymer poly[(4,4′-bis(2- ethylhexyl)dithieno[3,2-b:2′, 3′-d]silole)-2,6-diyl-alt-(4,7-bis(2- thienyl)-2,1,3-benzothiadiazole)-5,5′-diyl] with methanofullerene derivatives. The combination of ultrafast transient transmission and photoluminescence allows us to probe the relaxation of both exciton and polaron states in a relatively wide spectral and temporal range. Measurements reveal that the majority of excitations undergo ultrashort non-radiative relaxation while a small fraction of the photoexcited species decays slowly within hundreds of ps. In the blend films, significantly longer decays are observed suggesting the presence of long lived holes and/or charged-transfer type of excitons. © 2012 American Institute of Physics.en_US
dc.language.isoenen_US
dc.relation.ispartofApplied Physics Lettersen_US
dc.rights© American Institute of Physicsen_US
dc.subjectPolymer Solar Cellen_US
dc.subjectBulk Heterojunctionen_US
dc.subjectOrganic Photovoltaicen_US
dc.titleExcitation Dynamics of a Low Bandgap Silicon-bridged Dithiophene Copolymer and its Composites with Fullerenesen_US
dc.typeArticleen_US
dc.collaborationUniversity of Cyprusen_US
dc.collaborationCyprus University of Technologyen_US
dc.subject.categoryPhysical Sciencesen_US
dc.journalsSubscriptionen_US
dc.countryCyprusen_US
dc.subject.fieldEngineering and Technologyen_US
dc.publicationPeer Revieweden_US
dc.identifier.doi10.1063/1.3703601en_US
dc.identifier.scopus2-s2.0-84859802128en
dc.identifier.urlhttps://api.elsevier.com/content/abstract/scopus_id/84859802128en
dc.contributor.orcid#NODATA#en
dc.contributor.orcid#NODATA#en
dc.contributor.orcid#NODATA#en
dc.contributor.orcid#NODATA#en
dc.relation.issue15en_US
dc.relation.volume100en_US
cut.common.academicyear2011-2012en_US
item.languageiso639-1en-
item.cerifentitytypePublications-
item.openairecristypehttp://purl.org/coar/resource_type/c_6501-
item.fulltextNo Fulltext-
item.grantfulltextnone-
item.openairetypearticle-
crisitem.journal.journalissn1077-3118-
crisitem.journal.publisherAmerican Institute of Physics-
crisitem.author.deptDepartment of Mechanical Engineering and Materials Science and Engineering-
crisitem.author.deptDepartment of Mechanical Engineering and Materials Science and Engineering-
crisitem.author.facultyFaculty of Engineering and Technology-
crisitem.author.facultyFaculty of Engineering and Technology-
crisitem.author.orcid0000-0002-7899-6296-
crisitem.author.orcid0000-0003-2207-4193-
crisitem.author.parentorgFaculty of Engineering and Technology-
crisitem.author.parentorgFaculty of Engineering and Technology-
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