Please use this identifier to cite or link to this item: https://hdl.handle.net/20.500.14279/1403
DC FieldValueLanguage
dc.contributor.authorDenteneer, P. J H-
dc.contributor.authorKelires, Pantelis C.-
dc.contributor.otherΚελίρης, Παντελής-
dc.date.accessioned2013-03-06T16:51:06Zen
dc.date.accessioned2013-05-17T05:23:00Z-
dc.date.accessioned2015-12-02T10:12:22Z-
dc.date.available2013-03-06T16:51:06Zen
dc.date.available2013-05-17T05:23:00Z-
dc.date.available2015-12-02T10:12:22Z-
dc.date.issued1993-09-
dc.identifier.citationSolid State Communications,1993, vol. 87, no. 9, pp. 851-855en_US
dc.identifier.issn00381098-
dc.identifier.urihttps://hdl.handle.net/20.500.14279/1403-
dc.description.abstractHomopolar (like-atom) bonding and thresfold carbon coordination are found to drastically affect the electronic properties of amorphous silicon-carbon alloys. First-principles pseudopotential calculations based on amorphous geometries obtained from Monte Carlo empirical simulations show that incorporating C in Si-rich samples, in tetrahedral arrangements with heteropolar bonds only, increases the energy gap. This tendency is drastically reversed in C-rich samples because of graphitelike geometries. Like-atom bonds, in samples of all compositions, reduce the gap as well. The maximum gap is reached in samples of near-stoichiometric composition.en_US
dc.formatpdfen_US
dc.language.isoenen_US
dc.relation.ispartofSolid State Communicationsen_US
dc.rights© Elsevieren_US
dc.subjectCarbonen_US
dc.subjectGeometryen_US
dc.subjectMonte Carlo methoden_US
dc.subjectMathematical modelsen_US
dc.subjectSilicon alloysen_US
dc.subjectMolecular dynamicsen_US
dc.titleTheory of electronic properties of amorphous silicon-carbon alloys: effects of short-range disorderen_US
dc.typeArticleen_US
dc.affiliationUniversity of Creteen
dc.collaborationUniversity of Creteen_US
dc.collaborationLeiden Universityen_US
dc.journalsSubscriptionen_US
dc.countryGreeceen_US
dc.countryNetherlandsen_US
dc.subject.fieldSocial Sciencesen_US
dc.identifier.doi10.1016/0038-1098(93)90428-Pen_US
dc.dept.handle123456789/54en
dc.relation.issue9en_US
dc.relation.volume87en_US
cut.common.academicyear1995-1996en_US
dc.identifier.spage851en_US
dc.identifier.epage855en_US
item.languageiso639-1en-
item.cerifentitytypePublications-
item.fulltextNo Fulltext-
item.grantfulltextnone-
item.openairetypearticle-
item.openairecristypehttp://purl.org/coar/resource_type/c_6501-
crisitem.author.deptDepartment of Mechanical Engineering and Materials Science and Engineering-
crisitem.author.facultyFaculty of Engineering and Technology-
crisitem.author.orcid0000-0002-0268-259X-
crisitem.author.parentorgFaculty of Engineering and Technology-
crisitem.journal.journalissn0038-1098-
crisitem.journal.publisherElsevier-
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